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X-RAY DIFFRACTION
Materials and Methods page
3LEX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    Temperature 293.0
    Details 16% PEG 4000, 0.08 M CH3COONA, 0.04 M, TRIS PH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 34.54 α = 90.08
    b = 70.96 β = 90.02
    c = 78.26 γ = 90.29
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-04-02
     
    Diffraction Radiation
    Monochromator SI (220)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.000
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 5.0
    Resolution(High) 1.96
    Resolution(Low) 25.9
    Number Reflections(Observed) 49925
    Percent Possible(Observed) 94.6
    B(Isotropic) From Wilson Plot 19.46
     
    High Resolution Shell Details
    Resolution(High) 1.97
    Resolution(Low) 2.04
    Percent Possible(All) 94.7
    Mean I Over Sigma(Observed) 12.9
    R-Sym I(Observed) 0.092
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.97
    Resolution(Low) 25.9
    Cut-off Sigma(F) 0.06
    Number of Reflections(Observed) 49480
    Number of Reflections(R-Free) 1992
    Percent Reflections(Observed) 93.4
    R-Factor(Observed) 0.166
    R-Work 0.165
    R-Free 0.198
     
    Temperature Factor Modeling
    Mean Isotropic B Value 26.95
    Anisotropic B[1][1] 11.486
    Anisotropic B[1][2] 1.457
    Anisotropic B[1][3] -2.512
    Anisotropic B[2][2] -10.321
    Anisotropic B[2][3] 0.631
    Anisotropic B[3][3] -1.165
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.965
    Shell Resolution(Low) 2.014
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 3168
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.014
    Shell Resolution(Low) 2.069
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3431
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.235
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.069
    Shell Resolution(Low) 2.129
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3416
    R-Factor(R-Work) 0.176
    R-Factor(R-Free) 0.225
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.129
    Shell Resolution(Low) 2.198
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3434
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.198
    Shell Resolution(Low) 2.277
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3429
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.252
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.277
    Shell Resolution(Low) 2.368
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3473
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.225
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.368
    Shell Resolution(Low) 2.475
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3486
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.475
    Shell Resolution(Low) 2.606
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3433
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.256
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.606
    Shell Resolution(Low) 2.769
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3414
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.769
    Shell Resolution(Low) 2.982
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3413
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.982
    Shell Resolution(Low) 3.282
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3399
    R-Factor(R-Work) 0.162
    R-Factor(R-Free) 0.19
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.282
    Shell Resolution(Low) 3.756
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3362
    R-Factor(R-Work) 0.145
    R-Factor(R-Free) 0.165
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.756
    Shell Resolution(Low) 4.727
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3327
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.147
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.727
    Shell Resolution(Low) 25.903
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3303
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.154
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.06
    f_dihedral_angle_d 14.174
    f_angle_d 0.892
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6783
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 628
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    data extraction pdb_extract version: 3.005
    refinement phenix