ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Aggregation State PARTICLE
Name of Sample Mm-cpn rls with ATP
EM Data Acquisition
Date of Experiment --
Num of Micrographs-Images Used --
Temperature (Kelvin) --
Microscope Model JEM3200FSC
Detector Type Gatan 4Kx4K CCD camera
Minimum Defocus (nm) --
Maximum Defocus (nm) --
Minimum Tilt Angle (degrees) 0.0
Maximum Tilt Angle (degrees) 0.0
Nominal CS --
Imaging Mode BRIGHT FIELD
Electron Dose (electrons nm**-2) --
Illumination Mode FLOOD BEAM
Nominal Magnification --
Calibrated Magnification --
Source FIELD EMISSION GUN
Acceleration Voltage (kV) --
Imaging Details --
3D Reconstruction
Software Package(s) EMAN
Reconstruction Method
EM Image Reconstruction Statistics
Effective Resolution 6.7
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
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