ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details --
Sample Aggregation State PARTICLE
Sample Reconstruction Method SINGLE PARTICLE
Name of Sample Mm-cpn rls with ATP
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model JEOL 3200FSC
Detector Type GATAN ULTRASCAN 4000 (4k x 4k)
Minimum Defocus (nm) --
Maximum Defocus (nm) --
Minimum Tilt Angle (degrees) 0.0
Maximum Tilt Angle (degrees) 0.0
Nominal CS --
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) --
Illumination Mode FLOOD BEAM
Nominal Magnification --
Calibrated Magnification --
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details --
3D Reconstruction
Software Package(s) EMAN
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles --
Other Details --
Effective Resolution 6.7
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
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