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X-RAY DIFFRACTION
Materials and Methods page
3IXT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 17.5% PEG 8000, 0.2 M zinc acetate, 0.1 M cacodylate pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 90.75 α = 90
    b = 90.75 β = 90
    c = 232.06 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-04-04
     
    Diffraction Radiation
    Monochromator Si 220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 0.82656
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.75
    Resolution(Low) 50
    Number Reflections(All) 24653
    Number Reflections(Observed) 23510
    Percent Possible(Observed) 93.5
     
    High Resolution Shell Details
    Resolution(High) 2.75
    Resolution(Low) 2.85
    Percent Possible(All) 88.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.75
    Resolution(Low) 33.256
    Cut-off Sigma(F) 0.18
    Number of Reflections(all) 26212
    Number of Reflections(Observed) 23502
    Number of Reflections(R-Free) 1149
    Percent Reflections(Observed) 89.66
    R-Factor(Observed) 0.2162
    R-Work 0.2132
    R-Free 0.274
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.2235
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.2235
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.6855
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7457
    Shell Resolution(Low) 2.8706
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2274
    R-Factor(R-Work) 0.2883
    R-Factor(R-Free) 0.4061
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8706
    Shell Resolution(Low) 3.0219
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.252
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0219
    Shell Resolution(Low) 3.211
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2766
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.2976
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.211
    Shell Resolution(Low) 3.4587
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2820
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.3185
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4587
    Shell Resolution(Low) 3.8064
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2715
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8064
    Shell Resolution(Low) 4.3561
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3561
    Shell Resolution(Low) 5.4842
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2940
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4842
    Shell Resolution(Low) 33.258
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3059
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.054
    f_dihedral_angle_d 14.164
    f_angle_d 0.742
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6848
    Nucleic Acid Atoms 0
    Heterogen Atoms 12
    Solvent Atoms 150
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building PHASER