X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 17.5% PEG 8000, 0.2 M zinc acetate, 0.1 M cacodylate pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 90.75 α = 90
b = 90.75 β = 90
c = 232.06 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2009-04-04
Diffraction Radiation
Monochromator Protocol
Si 220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.82656 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 50 93.5 -- -- -- -- 24653 23510 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.75 2.85 88.3 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.75 33.256 -- 0.18 26212 23502 1149 89.66 -- 0.2162 0.2132 0.274 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7457 2.8706 -- 124 2274 0.2883 0.4061 -- 75.0
X Ray Diffraction 2.8706 3.0219 -- 127 2626 0.252 0.2797 -- 86.0
X Ray Diffraction 3.0219 3.211 -- 146 2766 0.2259 0.2976 -- 90.0
X Ray Diffraction 3.211 3.4587 -- 137 2820 0.23 0.3185 -- 92.0
X Ray Diffraction 3.4587 3.8064 -- 149 2911 0.2035 0.2715 -- 94.0
X Ray Diffraction 3.8064 4.3561 -- 126 2957 0.1806 0.2343 -- 94.0
X Ray Diffraction 4.3561 5.4842 -- 165 2940 0.1723 0.2122 -- 94.0
X Ray Diffraction 5.4842 33.258 -- 175 3059 0.2252 0.2948 -- 92.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -0.2235
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.2235
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.6855
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.054
f_dihedral_angle_d 14.164
f_angle_d 0.742
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6848
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 150

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine) refinement
PHASER model building