X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 277.0
Details 0.1M Hepes/NaOH ph 7.5, 0.2M CaCl2, 28% PEG 400, 5% glycerol, 2mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 82.18 α = 90
b = 112.17 β = 90
c = 62.73 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2009-03-04
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.87314 SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.05 34.03 99.1 -- 0.055 -- 5.5 134589 133400 -3.0 -3.0 12.532
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.05 1.1 97.5 -- 0.397 -- 3.9 16942

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.05 25.0 -- -- -- 126774 6621 99.12 -- 0.12971 0.12857 0.1509 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.05 1.077 -- 465 9002 0.182 0.193 -- 96.19
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 9.982
Anisotropic B[1][1] 0.08
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.9
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.98
RMS Deviations
Key Refinement Restraint Deviation
r_sphericity_bonded 6.764
r_sphericity_free 15.637
r_rigid_bond_restr 2.464
r_scangle_it 6.741
r_scbond_it 4.901
r_mcangle_it 3.108
r_mcbond_other 1.074
r_mcbond_it 2.113
r_gen_planes_other 0.001
r_gen_planes_refined 0.011
r_chiral_restr 0.16
r_dihedral_angle_4_deg 16.048
r_dihedral_angle_3_deg 13.546
r_dihedral_angle_2_deg 33.404
r_dihedral_angle_1_deg 12.089
r_angle_other_deg 1.159
r_angle_refined_deg 2.198
r_bond_other_d 0.004
r_bond_refined_d 0.028
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1909
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 492

Software

Computing
Computing Package Purpose
SLS internal software Data Collection
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
REFMAC 5.5.0070 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0070 refinement
PHASER model building
SLS version: internal software data collection