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X-RAY DIFFRACTION
Materials and Methods page
3INB
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Temperature 293.0
    Details 12% PEG-8000, 0.2 M Ammonium Sulphate 2% PEG-400, 1% 1,2,3 heptanetriol, 1 mM Sodium Tungstate, 0.1 M Mes, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.36 α = 90
    b = 105.83 β = 90
    c = 208.71 γ = 90
     
    Space Group
    Space Group Name:    P 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 345 mm plate
    Collection Date 2003-01-31
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type EMBL/DESY, HAMBURG BEAMLINE BW7B
    Wavelength 0.845
    Site EMBL/DESY, HAMBURG
    Beamline BW7B
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.1
    Resolution(Low) 20
    Number Reflections(Observed) 33285
    Percent Possible(Observed) 96.0
    R Merge I(Observed) 0.048
    B(Isotropic) From Wilson Plot 101.02
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.2
    Percent Possible(All) 96.0
    R Merge I(Observed) 0.38
    Mean I Over Sigma(Observed) 2.1
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.1
    Resolution(Low) 14.976
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 31869
    Number of Reflections(R-Free) 1588
    Percent Reflections(Observed) 96.04
    R-Factor(Observed) 0.2283
    R-Work 0.2266
    R-Free 0.2592
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 56.3438
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -40.0922
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -16.2516
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1
    Shell Resolution(Low) 3.1991
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.4083
    R-Factor(R-Free) 0.4465
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1991
    Shell Resolution(Low) 3.3123
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.3694
    R-Factor(R-Free) 0.4041
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3123
    Shell Resolution(Low) 3.4434
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.3284
    R-Factor(R-Free) 0.3292
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4434
    Shell Resolution(Low) 3.598
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.288
    R-Factor(R-Free) 0.3504
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.598
    Shell Resolution(Low) 3.7848
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.2746
    R-Factor(R-Free) 0.2937
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7848
    Shell Resolution(Low) 4.0177
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.2366
    R-Factor(R-Free) 0.2562
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0177
    Shell Resolution(Low) 4.3209
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3209
    Shell Resolution(Low) 4.7432
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2772
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2435
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7432
    Shell Resolution(Low) 5.4011
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2028
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4011
    Shell Resolution(Low) 6.7018
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2807
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.2415
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7018
    Shell Resolution(Low) 14.9762
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2874
    R-Factor(R-Work) 0.1964
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.112
    f_dihedral_angle_d 26.624
    f_angle_d 1.497
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8235
    Nucleic Acid Atoms 0
    Heterogen Atoms 99
    Solvent Atoms 8
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building Phaser
    data collection MAR345dtb