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X-RAY DIFFRACTION
Materials and Methods page
3IDY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 293.0
    Details 8 % PEG 8000, 6.5 % Isopropanol, 200 mM Ammonium sulfate, 100 mM HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 106.17 α = 90
    b = 204.32 β = 90
    c = 216.89 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2008-10-06
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.0000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Resolution(High) 3.2
    Resolution(Low) 50
    Number Reflections(Observed) 35856
    Percent Possible(Observed) 86.5
    Redundancy 5.2
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.31
    Percent Possible(All) 34.0
    Mean I Over Sigma(Observed) 1.7
    R-Sym I(Observed) 0.45
    Redundancy 1.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.2
    Resolution(Low) 43.204
    Cut-off Sigma(F) 1.89
    Number of Reflections(Observed) 35358
    Number of Reflections(R-Free) 1778
    Percent Reflections(Observed) 47.07
    R-Factor(Observed) 0.1977
    R-Work 0.1955
    R-Free 0.2366
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2
    Shell Resolution(Low) 3.2866
    Number of Reflections(R-Free) 59
    Number of Reflections(R-Work) 1249
    R-Factor(R-Work) 0.2856
    R-Factor(R-Free) 0.3897
    Percent Reflections(Observed) 23.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2866
    Shell Resolution(Low) 3.3833
    Number of Reflections(R-Free) 92
    Number of Reflections(R-Work) 1815
    R-Factor(R-Work) 0.2726
    R-Factor(R-Free) 0.304
    Percent Reflections(Observed) 33.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3833
    Shell Resolution(Low) 3.4924
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2233
    R-Factor(R-Work) 0.2465
    R-Factor(R-Free) 0.293
    Percent Reflections(Observed) 41.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4924
    Shell Resolution(Low) 3.6172
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2812
    Percent Reflections(Observed) 47.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6172
    Shell Resolution(Low) 3.7619
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.2085
    R-Factor(R-Free) 0.2749
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7619
    Shell Resolution(Low) 3.933
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2822
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 51.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.933
    Shell Resolution(Low) 4.1402
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.1719
    R-Factor(R-Free) 0.213
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1402
    Shell Resolution(Low) 4.3994
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2886
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.1814
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3994
    Shell Resolution(Low) 4.7387
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2841
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7387
    Shell Resolution(Low) 5.2148
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2875
    R-Factor(R-Work) 0.1449
    R-Factor(R-Free) 0.2066
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2148
    Shell Resolution(Low) 5.9678
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2873
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9678
    Shell Resolution(Low) 7.5123
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2931
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2498
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.5123
    Shell Resolution(Low) 43.2083
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 2963
    R-Factor(R-Work) 0.2193
    R-Factor(R-Free) 0.2331
    Percent Reflections(Observed) 54.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.051
    f_dihedral_angle_d 15.911
    f_angle_d 0.796
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11489
    Nucleic Acid Atoms 0
    Heterogen Atoms 397
    Solvent Atoms 152
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX
     
    Software
    refinement PHENIX
    model building Phaser
    data collection HKL-2000