X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 293.0
Details 8 % PEG 8000, 6.5 % Isopropanol, 200 mM Ammonium sulfate, 100 mM HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 106.17 α = 90
b = 204.32 β = 90
c = 216.89 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2008-10-06
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0000 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 50 86.5 -- 0.099 -- 5.2 -- 35856 0.0 -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.2 3.31 34.0 -- 0.45 1.7 1.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.2 43.204 -- 1.89 -- 35358 1778 47.07 -- 0.1977 0.1955 0.2366 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.2 3.2866 -- 59 1249 0.2856 0.3897 -- 23.0
X Ray Diffraction 3.2866 3.3833 -- 92 1815 0.2726 0.304 -- 33.0
X Ray Diffraction 3.3833 3.4924 -- 124 2233 0.2465 0.293 -- 41.0
X Ray Diffraction 3.4924 3.6172 -- 135 2565 0.225 0.2812 -- 47.0
X Ray Diffraction 3.6172 3.7619 -- 139 2732 0.2085 0.2749 -- 50.0
X Ray Diffraction 3.7619 3.933 -- 155 2822 0.1926 0.2264 -- 51.0
X Ray Diffraction 3.933 4.1402 -- 158 2795 0.1719 0.213 -- 52.0
X Ray Diffraction 4.1402 4.3994 -- 134 2886 0.1627 0.1814 -- 52.0
X Ray Diffraction 4.3994 4.7387 -- 153 2841 0.1468 0.2054 -- 52.0
X Ray Diffraction 4.7387 5.2148 -- 153 2875 0.1449 0.2066 -- 52.0
X Ray Diffraction 5.2148 5.9678 -- 153 2873 0.1633 0.2326 -- 53.0
X Ray Diffraction 5.9678 7.5123 -- 145 2931 0.2038 0.2498 -- 53.0
X Ray Diffraction 7.5123 43.2083 -- 178 2963 0.2193 0.2331 -- 54.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.051
f_dihedral_angle_d 15.911
f_angle_d 0.796
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11489
Nucleic Acid Atoms 0
Heterogen Atoms 397
Solvent Atoms 152

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX Structure Refinement
Software
Software Name Purpose
PHENIX refinement
Phaser model building
HKL-2000 data collection