X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 293.0
Details 8 % PEG 8000, 6.5 % Isopropanol, 200 mM Ammonium sulfate, 100 mM HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 112.61 α = 90
b = 203.96 β = 90
c = 109.29 γ = 90
Symmetry
Space Group C 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2008-10-06
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0000 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 81.0 -- 0.081 -- 8.5 42470 34810 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.59 35.0 -- 0.51 1.6 3.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 39.2184 -- 1.33 34358 34645 1776 78.98 -- 0.1814 0.1783 0.2391 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.5676 -- 39 930 0.2663 0.2839 -- 29.0
X Ray Diffraction 2.5676 2.6432 -- 60 1326 0.278 0.3346 -- 42.0
X Ray Diffraction 2.6432 2.7285 -- 84 1653 0.295 0.3508 -- 52.0
X Ray Diffraction 2.7285 2.826 -- 101 1926 0.2649 0.3285 -- 61.0
X Ray Diffraction 2.826 2.9391 -- 123 2249 0.2613 0.3578 -- 71.0
X Ray Diffraction 2.9391 3.0728 -- 137 2613 0.2524 0.308 -- 82.0
X Ray Diffraction 3.0728 3.2347 -- 174 2841 0.2358 0.287 -- 90.0
X Ray Diffraction 3.2347 3.4373 -- 192 3097 0.2117 0.2828 -- 98.0
X Ray Diffraction 3.4373 3.7025 -- 184 3172 0.184 0.2759 -- 100.0
X Ray Diffraction 3.7025 4.0747 -- 167 3198 0.1593 0.2399 -- 100.0
X Ray Diffraction 4.0747 4.6635 -- 159 3244 0.1306 0.1723 -- 100.0
X Ray Diffraction 4.6635 5.8724 -- 175 3261 0.1349 0.2096 -- 100.0
X Ray Diffraction 5.8724 39.2184 -- 181 3359 0.1797 0.2168 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.053
f_dihedral_angle_d 15.394
f_angle_d 0.874
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5751
Nucleic Acid Atoms 0
Heterogen Atoms 278
Solvent Atoms 233

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX Structure Refinement
Software
Software Name Purpose
PHENIX refinement
Phaser model building
HKL-2000 data collection