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An Information Portal to 105339 Biological Macromolecular Structures

X-RAY DIFFRACTION
Materials and Methods page
3IDX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 293.0
    Details 8 % PEG 8000, 6.5 % Isopropanol, 200 mM Ammonium sulfate, 100 mM HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 112.61 α = 90
    b = 203.96 β = 90
    c = 109.29 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2008-10-06
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.0000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 42470
    Number Reflections(Observed) 34810
    Percent Possible(Observed) 81.0
    Redundancy 8.5
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 35.0
    Mean I Over Sigma(Observed) 1.6
    R-Sym I(Observed) 0.51
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 39.2184
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 34358
    Number of Reflections(Observed) 34645
    Number of Reflections(R-Free) 1776
    Percent Reflections(Observed) 78.98
    R-Factor(Observed) 0.1814
    R-Work 0.1783
    R-Free 0.2391
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.5676
    Number of Reflections(R-Free) 39
    Number of Reflections(R-Work) 930
    R-Factor(R-Work) 0.2663
    R-Factor(R-Free) 0.2839
    Percent Reflections(Observed) 29.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5676
    Shell Resolution(Low) 2.6432
    Number of Reflections(R-Free) 60
    Number of Reflections(R-Work) 1326
    R-Factor(R-Work) 0.278
    R-Factor(R-Free) 0.3346
    Percent Reflections(Observed) 42.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6432
    Shell Resolution(Low) 2.7285
    Number of Reflections(R-Free) 84
    Number of Reflections(R-Work) 1653
    R-Factor(R-Work) 0.295
    R-Factor(R-Free) 0.3508
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7285
    Shell Resolution(Low) 2.826
    Number of Reflections(R-Free) 101
    Number of Reflections(R-Work) 1926
    R-Factor(R-Work) 0.2649
    R-Factor(R-Free) 0.3285
    Percent Reflections(Observed) 61.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.826
    Shell Resolution(Low) 2.9391
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2249
    R-Factor(R-Work) 0.2613
    R-Factor(R-Free) 0.3578
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9391
    Shell Resolution(Low) 3.0728
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.2524
    R-Factor(R-Free) 0.308
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0728
    Shell Resolution(Low) 3.2347
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2841
    R-Factor(R-Work) 0.2358
    R-Factor(R-Free) 0.287
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2347
    Shell Resolution(Low) 3.4373
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3097
    R-Factor(R-Work) 0.2117
    R-Factor(R-Free) 0.2828
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4373
    Shell Resolution(Low) 3.7025
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3172
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2759
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7025
    Shell Resolution(Low) 4.0747
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3198
    R-Factor(R-Work) 0.1593
    R-Factor(R-Free) 0.2399
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0747
    Shell Resolution(Low) 4.6635
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3244
    R-Factor(R-Work) 0.1306
    R-Factor(R-Free) 0.1723
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6635
    Shell Resolution(Low) 5.8724
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3261
    R-Factor(R-Work) 0.1349
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8724
    Shell Resolution(Low) 39.2184
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3359
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2168
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.053
    f_dihedral_angle_d 15.394
    f_angle_d 0.874
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5751
    Nucleic Acid Atoms 0
    Heterogen Atoms 278
    Solvent Atoms 233
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX
     
    Software
    refinement PHENIX
    model building Phaser
    data collection HKL-2000