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X-RAY DIFFRACTION
Materials and Methods page
3ICK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 298.0
    Details PEG 4000, 200mM Ammonium Sulfate, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.1 α = 90
    b = 58.1 β = 90
    c = 390.57 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2005-10-31
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.1
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(Observed) 15342
    Percent Possible(Observed) 92.2
    R Merge I(Observed) 0.09
    Redundancy 8.9
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.49
    Percent Possible(All) 71.0
    R Merge I(Observed) 0.526
    Redundancy 6.1
    Number Unique Reflections(All) 1115
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 2.4
    Resolution(Low) 39.81
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 15221
    Number of Reflections(R-Free) 772
    Percent Reflections(Observed) 92.15
    R-Factor(Observed) 0.184
    R-Work 0.181
    R-Free 0.259
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 39.03
    Anisotropic B[1][1] 2.83
    Anisotropic B[1][2] 1.41
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.83
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.24
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.463
    Number of Reflections(R-Free) 41
    Number of Reflections(R-Work) 767
    R-Factor(R-Work) 0.212
    R-Factor(R-Free) 0.307
    Percent Reflections(Observed) 69.72
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.841
    r_scbond_it 2.493
    r_mcangle_it 1.533
    r_mcbond_it 0.906
    r_symmetry_hbond_refined 0.278
    r_symmetry_vdw_refined 0.27
    r_bond_refined_d 0.017
    r_angle_refined_deg 1.861
    r_dihedral_angle_1_deg 5.474
    r_dihedral_angle_2_deg 39.598
    r_dihedral_angle_3_deg 18.407
    r_dihedral_angle_4_deg 22.815
    r_chiral_restr 0.189
    r_gen_planes_refined 0.006
    r_nbd_refined 0.236
    r_nbtor_refined 0.31
    r_xyhbond_nbd_refined 0.235
    r_metal_ion_refined 0.032
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2891
    Nucleic Acid Atoms 0
    Heterogen Atoms 51
    Solvent Atoms 233
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL
    Structure Solution direct refinement
    Structure Refinement REFMAC 5.2.0019
     
    Software
    data extraction pdb_extract version: 3.005
    refinement REFMAC5
    data processing HKL