X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 297.0
Details 0.1M Bis-tris, 20%(w/v) PEG MME5000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 297K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.5 α = 90
b = 246.35 β = 90.2
c = 73.66 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 mirror 2009-04-09
Diffraction Radiation
Monochromator Protocol
Si 111 crystal MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97937, 0.97953 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.15 44 99.1 0.107 -- -- 3.6 138959 138959 0.0 0.0 36.45
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.15 2.19 93.6 0.46 -- 2.2 3.0 6506

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.15 43.9 0.0 0.0 131911 131911 6975 98.86 0.1885 0.1885 0.18612 0.23338 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.155 2.211 9599 421 9178 0.223 0.284 -- 92.48
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 27.825
Anisotropic B[1][1] 0.0
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -0.1
Anisotropic B[2][2] 0.05
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.05
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 3.052
r_scbond_it 2.023
r_mcangle_it 1.084
r_mcbond_it 0.587
r_gen_planes_refined 0.006
r_chiral_restr 0.103
r_dihedral_angle_4_deg 19.954
r_dihedral_angle_3_deg 17.335
r_dihedral_angle_2_deg 36.346
r_dihedral_angle_1_deg 5.963
r_angle_refined_deg 1.427
r_bond_refined_d 0.013
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 14813
Nucleic Acid Atoms 0
Heterogen Atoms 216
Solvent Atoms 981

Software

Computing
Computing Package Purpose
SBC-collect Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
SHELXD/MLPHARE/DM/Arp/Warp/HKL3000 Structure Solution
REFMAC 5.5.0054 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0054 refinement
SHELXD/MLPHARE/DM/Arp/Warp/HKL3000 model building
SBC-collect data collection