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X-RAY DIFFRACTION
Materials and Methods page
3IC9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 297.0
    Details 0.1M Bis-tris, 20%(w/v) PEG MME5000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.5 α = 90
    b = 246.35 β = 90.2
    c = 73.66 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirror
    Collection Date 2009-04-09
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97937, 0.97953
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.15
    Resolution(Low) 44
    Number Reflections(All) 138959
    Number Reflections(Observed) 138959
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.107
    B(Isotropic) From Wilson Plot 36.45
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.19
    Percent Possible(All) 93.6
    R Merge I(Observed) 0.46
    Mean I Over Sigma(Observed) 2.2
    Redundancy 3.0
    Number Unique Reflections(All) 6506
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.15
    Resolution(Low) 43.9
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 131911
    Number of Reflections(Observed) 131911
    Number of Reflections(R-Free) 6975
    Percent Reflections(Observed) 98.86
    R-Factor(All) 0.1885
    R-Factor(Observed) 0.1885
    R-Work 0.18612
    R-Free 0.23338
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 27.825
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.1
    Anisotropic B[2][2] 0.05
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.05
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.155
    Shell Resolution(Low) 2.211
    Number of Reflections(Observed) 9599
    Number of Reflections(R-Free) 421
    Number of Reflections(R-Work) 9178
    R-Factor(R-Work) 0.223
    R-Factor(R-Free) 0.284
    Percent Reflections(Observed) 92.48
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.052
    r_scbond_it 2.023
    r_mcangle_it 1.084
    r_mcbond_it 0.587
    r_gen_planes_refined 0.006
    r_chiral_restr 0.103
    r_dihedral_angle_4_deg 19.954
    r_dihedral_angle_3_deg 17.335
    r_dihedral_angle_2_deg 36.346
    r_dihedral_angle_1_deg 5.963
    r_angle_refined_deg 1.427
    r_bond_refined_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 14813
    Nucleic Acid Atoms 0
    Heterogen Atoms 216
    Solvent Atoms 981
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELXD/MLPHARE/DM/Arp/Warp/HKL3000
    Structure Refinement REFMAC 5.5.0054
     
    Software
    refinement REFMAC version: 5.5.0054
    model building SHELXD/MLPHARE/DM/Arp/Warp/HKL3000
    data collection SBC-collect