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X-RAY DIFFRACTION
Materials and Methods page
3HWW
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    Temperature 295.0
    Details 0.5-0.6M tri-Na citrate, 1mM oxoglutarate, 5mM MgCl2, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.91 α = 90
    b = 117.91 β = 90
    c = 175.28 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Details mirrors
    Collection Date 2008-12-17
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PAL/PLS BEAMLINE 4A
    Wavelength List 1.0000
    Site PAL/PLS
    Beamline 4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 85185
    Number Reflections(Observed) 80890
    Percent Possible(Observed) 94.2
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 38.5
    Redundancy 8.0
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.02
    Percent Possible(All) 84.9
    R Merge I(Observed) 0.18
    Mean I Over Sigma(Observed) 1.85
    R-Sym I(Observed) 0.4
    Redundancy 4.4
    Number Unique Reflections(All) 7553
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 34.32
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 85185
    Number of Reflections(Observed) 80890
    Number of Reflections(R-Free) 4244
    Percent Reflections(Observed) 94.21
    R-Factor(Observed) 0.21104
    R-Work 0.20881
    R-Free 0.25453
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 38.501
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.01
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0
    Number of Reflections(R-Free) 281
    Number of Reflections(R-Work) 5282
    R-Factor(R-Work) 0.4
    R-Factor(R-Free) 0.395
    Percent Reflections(Observed) 84.44
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.786
    r_scbond_it 3.084
    r_mcangle_it 1.94
    r_mcbond_it 1.085
    r_gen_planes_refined 0.01
    r_chiral_restr 0.149
    r_dihedral_angle_4_deg 19.952
    r_dihedral_angle_3_deg 18.283
    r_dihedral_angle_2_deg 38.243
    r_dihedral_angle_1_deg 7.159
    r_angle_refined_deg 1.973
    r_bond_refined_d 0.02
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8322
    Nucleic Acid Atoms 0
    Heterogen Atoms 97
    Solvent Atoms 331
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MR
    Structure Refinement REFMAC 5.5.0072
     
    Software
    refinement REFMAC version: 5.5.0072
    model building MR
    data collection HKL-2000