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X-RAY DIFFRACTION
Materials and Methods page
3HAI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 0.1 M Hepes pH 7.0, 18% PEG3350, 1% Tryptone, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 163.62 α = 90
    b = 32.16 β = 111.23
    c = 181.16 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 110
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 210
    Collection Date 2007-12-07
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.9798
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.88
    Resolution(Low) 48.52
    Number Reflections(All) 76038
    B(Isotropic) From Wilson Plot 86.9
    Redundancy 2.6
     
    High Resolution Shell Details
    Resolution(High) 2.88
    Resolution(Low) 3.06
    Percent Possible(All) 41.2
    Mean I Over Sigma(Observed) 2.1
    Redundancy 2.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.881
    Resolution(Low) 48.52
    Cut-off Sigma(F) 1.27
    Number of Reflections(all) 76038
    Number of Reflections(Observed) 40991
    Number of Reflections(R-Free) 2076
    Percent Reflections(Observed) 98.81
    R-Factor(Observed) 0.2843
    R-Work 0.2824
    R-Free 0.3185
     
    Temperature Factor Modeling
    Mean Isotropic B Value 85.918
    Anisotropic B[1][1] -6.897
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.509
    Anisotropic B[2][2] 9.933
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -30.011
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.881
    Shell Resolution(Low) 2.9481
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2264
    R-Factor(R-Work) 0.3846
    R-Factor(R-Free) 0.4339
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9481
    Shell Resolution(Low) 3.0218
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.3424
    R-Factor(R-Free) 0.3964
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0218
    Shell Resolution(Low) 3.1035
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.3389
    R-Factor(R-Free) 0.3801
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1035
    Shell Resolution(Low) 3.1948
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.3536
    R-Factor(R-Free) 0.3575
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1948
    Shell Resolution(Low) 3.2979
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2526
    R-Factor(R-Work) 0.3404
    R-Factor(R-Free) 0.3807
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2979
    Shell Resolution(Low) 3.4157
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.3295
    R-Factor(R-Free) 0.3237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4157
    Shell Resolution(Low) 3.5524
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.3082
    R-Factor(R-Free) 0.3398
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5524
    Shell Resolution(Low) 3.7141
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.2922
    R-Factor(R-Free) 0.3603
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7141
    Shell Resolution(Low) 3.9098
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.282
    R-Factor(R-Free) 0.3108
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9098
    Shell Resolution(Low) 4.1546
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2574
    R-Factor(R-Free) 0.2819
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1546
    Shell Resolution(Low) 4.4752
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.2448
    R-Factor(R-Free) 0.2657
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4752
    Shell Resolution(Low) 4.9252
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.235
    R-Factor(R-Free) 0.3054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9252
    Shell Resolution(Low) 5.6369
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.2471
    R-Factor(R-Free) 0.2811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6369
    Shell Resolution(Low) 7.0984
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.2723
    R-Factor(R-Free) 0.3021
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.0984
    Shell Resolution(Low) 48.5277
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2775
    R-Factor(R-Work) 0.2337
    R-Factor(R-Free) 0.2904
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.073
    f_dihedral_angle_d 19.876
    f_angle_d 1.166
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9532
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 20
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MLPHARE
    Structure Refinement PHENIX (phenix.refine: 2009_02_15_2320_3)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building MLPHARE
    data collection ADSC version: Quantum