X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6
Temperature 293.0
Details 0.1M BisTris, 17% PEG3350, pH 6.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.89 α = 90
b = 82.73 β = 106.48
c = 41.16 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2007-12-14
Diffraction Radiation
Monochromator Protocol
custom SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97915 APS 19-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 40 98.2 0.063 -- -- 4.3 28092 28092 -3.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.65 1.68 95.2 0.519 -- 2.1 3.4 1354

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.65 22.71 -- -- 28092 28092 1409 98.2 0.19907 0.19907 0.19715 0.23638 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.65 1.68 1354 103 1827 0.298 0.372 -- 95.2
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 20.486
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 3.559
r_scbond_it 2.452
r_mcangle_it 1.588
r_mcbond_it 1.027
r_nbd_refined 0.214
r_gen_planes_refined 0.007
r_chiral_restr 0.102
r_dihedral_angle_4_deg 16.084
r_dihedral_angle_3_deg 13.196
r_dihedral_angle_2_deg 38.129
r_dihedral_angle_1_deg 6.839
r_angle_refined_deg 1.481
r_bond_refined_d 0.013
r_nbtor_refined 0.303
r_xyhbond_nbd_refined 0.1
r_symmetry_vdw_refined 0.206
r_symmetry_hbond_refined 0.204
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2024
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1791
Nucleic Acid Atoms 0
Heterogen Atoms 20
Solvent Atoms 182

Software

Computing
Computing Package Purpose
HKL-3000 Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
REFMAC Structure Solution
REFMAC 5.2.0005 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.2.0005 refinement
REFMAC model building
HKL-3000 data collection