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X-RAY DIFFRACTION
Materials and Methods page
3GZQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 298.0
    Details 1.6 M ammonium sulfate, 0.1 M MES, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.51 α = 90
    b = 58.81 β = 90
    c = 104.94 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2004-11-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.1
    Wavelength List 1.0
    Site ALS
    Beamline 8.2.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.4
    Resolution(Low) 50
    Number Reflections(Observed) 49673
    Percent Possible(Observed) 99.0
    B(Isotropic) From Wilson Plot 18.9
    Redundancy 6.7
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.45
    Percent Possible(All) 93.2
    Mean I Over Sigma(Observed) 2.2
    R-Sym I(Observed) 0.582
    Redundancy 4.4
    Number Unique Reflections(All) 4589
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.401
    Resolution(Low) 30.064
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 49501
    Number of Reflections(R-Free) 2518
    Percent Reflections(Observed) 98.76
    R-Factor(Observed) 0.1659
    R-Work 0.1644
    R-Free 0.1933
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model ANISOTROPIC
    Mean Isotropic B Value 24.3
    Anisotropic B[1][1] -3.8219
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.847
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.9749
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.401
    Shell Resolution(Low) 1.4277
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2305
    R-Factor(R-Work) 0.2138
    R-Factor(R-Free) 0.2539
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4277
    Shell Resolution(Low) 1.4569
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2516
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.1981
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4569
    Shell Resolution(Low) 1.4886
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4886
    Shell Resolution(Low) 1.5232
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.1884
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5232
    Shell Resolution(Low) 1.5613
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1338
    R-Factor(R-Free) 0.1769
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5613
    Shell Resolution(Low) 1.6035
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.1237
    R-Factor(R-Free) 0.1732
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6035
    Shell Resolution(Low) 1.6507
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1227
    R-Factor(R-Free) 0.1573
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6507
    Shell Resolution(Low) 1.7039
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1191
    R-Factor(R-Free) 0.1757
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7039
    Shell Resolution(Low) 1.7648
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.1233
    R-Factor(R-Free) 0.1541
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7648
    Shell Resolution(Low) 1.8355
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1236
    R-Factor(R-Free) 0.1791
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8355
    Shell Resolution(Low) 1.919
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1333
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.919
    Shell Resolution(Low) 2.0202
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1617
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0202
    Shell Resolution(Low) 2.1467
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.1807
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1467
    Shell Resolution(Low) 2.3124
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1755
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3124
    Shell Resolution(Low) 2.545
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1749
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.545
    Shell Resolution(Low) 2.913
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.1893
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.913
    Shell Resolution(Low) 3.669
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1608
    R-Factor(R-Free) 0.1767
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.669
    Shell Resolution(Low) 30.0705
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2028
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_angle_deg 1.012
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1802
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 251
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.4_4)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.4_4)
    model building MOLREP