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X-RAY DIFFRACTION
Materials and Methods page
3FOF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 295.0
    Details 50mM Na cacodylate, 100mM Ammonium acetate, 15mM Magnesium acetate, 7.5% isopropanol, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 121.6 α = 90
    b = 121.6 β = 90
    c = 178.7 γ = 120
     
    Space Group
    Space Group Name:    P 32
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2008-06-27
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength List 0.97
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.2
    Resolution(Low) 34.07
    Number Reflections(Observed) 44580
    B(Isotropic) From Wilson Plot 178.14
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.0
    Resolution(Low) 34.066
    Cut-off Sigma(F) 1.98
    Number of Reflections(Observed) 24685
    Number of Reflections(R-Free) 2492
    Percent Reflections(Observed) 98.92
    R-Factor(Observed) 0.2441
    R-Work 0.239
    R-Free 0.2892
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 198.798
    Anisotropic B[1][1] -7.561
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -7.561
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.421
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0001
    Shell Resolution(Low) 4.0769
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1279
    R-Factor(R-Work) 0.2687
    R-Factor(R-Free) 0.3108
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0769
    Shell Resolution(Low) 4.16
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1202
    R-Factor(R-Work) 0.2509
    R-Factor(R-Free) 0.314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.16
    Shell Resolution(Low) 4.2503
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1264
    R-Factor(R-Work) 0.2303
    R-Factor(R-Free) 0.3015
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2503
    Shell Resolution(Low) 4.349
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1235
    R-Factor(R-Work) 0.2213
    R-Factor(R-Free) 0.2674
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.349
    Shell Resolution(Low) 4.4575
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1246
    R-Factor(R-Work) 0.2205
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4575
    Shell Resolution(Low) 4.5778
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1246
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2821
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5778
    Shell Resolution(Low) 4.7121
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1261
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2594
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7121
    Shell Resolution(Low) 4.8638
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 1276
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8638
    Shell Resolution(Low) 5.0371
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1235
    R-Factor(R-Work) 0.2172
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0371
    Shell Resolution(Low) 5.2381
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1221
    R-Factor(R-Work) 0.2346
    R-Factor(R-Free) 0.2893
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2381
    Shell Resolution(Low) 5.4756
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1235
    R-Factor(R-Work) 0.2508
    R-Factor(R-Free) 0.298
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4756
    Shell Resolution(Low) 5.763
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1272
    R-Factor(R-Work) 0.2699
    R-Factor(R-Free) 0.3613
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.763
    Shell Resolution(Low) 6.1221
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1225
    R-Factor(R-Work) 0.287
    R-Factor(R-Free) 0.3774
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1221
    Shell Resolution(Low) 6.5916
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1239
    R-Factor(R-Work) 0.2896
    R-Factor(R-Free) 0.3195
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5916
    Shell Resolution(Low) 7.2492
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.3129
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2492
    Shell Resolution(Low) 8.285
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1233
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.285
    Shell Resolution(Low) 10.3888
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1253
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 10.3888
    Shell Resolution(Low) 34.0668
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 1011
    R-Factor(R-Work) 0.2632
    R-Factor(R-Free) 0.2986
    Percent Reflections(Observed) 81.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.918
    f_plane_restr 0.012
    f_chiral_restr 0.051
    f_angle_d 1.208
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7020
    Nucleic Acid Atoms 1374
    Heterogen Atoms 58
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building Phaser