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X-RAY DIFFRACTION
Materials and Methods page
3FOE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 295.0
    Details 50mM Na cacodylate, 100mM Ammonium acetate, 15mM Magnesium acetate, 7.5% isopropanol, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 121.68 α = 90
    b = 121.68 β = 90
    c = 179.39 γ = 120
     
    Space Group
    Space Group Name:    P 32
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2008-06-27
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength List 0.97
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.5
    Resolution(Low) 36.1
    Number Reflections(Observed) 34810
    B(Isotropic) From Wilson Plot 176.35
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.001
    Resolution(Low) 36.1
    Cut-off Sigma(F) 1.96
    Number of Reflections(Observed) 24916
    Number of Reflections(R-Free) 2521
    Percent Reflections(Observed) 99.38
    R-Factor(Observed) 0.2635
    R-Work 0.2581
    R-Free 0.3131
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 202.667
    Anisotropic B[1][1] -17.079
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -17.079
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -31.577
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0006
    Shell Resolution(Low) 4.0774
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1289
    R-Factor(R-Work) 0.303
    R-Factor(R-Free) 0.385
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0774
    Shell Resolution(Low) 4.1605
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1249
    R-Factor(R-Work) 0.2812
    R-Factor(R-Free) 0.3338
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1605
    Shell Resolution(Low) 4.2508
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1265
    R-Factor(R-Work) 0.266
    R-Factor(R-Free) 0.3677
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2508
    Shell Resolution(Low) 4.3496
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1261
    R-Factor(R-Work) 0.2707
    R-Factor(R-Free) 0.307
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3496
    Shell Resolution(Low) 4.4581
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 1228
    R-Factor(R-Work) 0.2498
    R-Factor(R-Free) 0.3054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4581
    Shell Resolution(Low) 4.5785
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1249
    R-Factor(R-Work) 0.2327
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5785
    Shell Resolution(Low) 4.7129
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1236
    R-Factor(R-Work) 0.2347
    R-Factor(R-Free) 0.3082
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7129
    Shell Resolution(Low) 4.8647
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1266
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.2994
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8647
    Shell Resolution(Low) 5.0381
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1257
    R-Factor(R-Work) 0.2446
    R-Factor(R-Free) 0.3047
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0381
    Shell Resolution(Low) 5.2392
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 1229
    R-Factor(R-Work) 0.2466
    R-Factor(R-Free) 0.2921
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2392
    Shell Resolution(Low) 5.4769
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 1238
    R-Factor(R-Work) 0.2759
    R-Factor(R-Free) 0.3335
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4769
    Shell Resolution(Low) 5.7646
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1266
    R-Factor(R-Work) 0.2828
    R-Factor(R-Free) 0.3468
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7646
    Shell Resolution(Low) 6.1241
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1219
    R-Factor(R-Work) 0.2841
    R-Factor(R-Free) 0.3422
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1241
    Shell Resolution(Low) 6.5943
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1267
    R-Factor(R-Work) 0.2898
    R-Factor(R-Free) 0.3776
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5943
    Shell Resolution(Low) 7.2531
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1248
    R-Factor(R-Work) 0.2712
    R-Factor(R-Free) 0.3314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2531
    Shell Resolution(Low) 8.2915
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1227
    R-Factor(R-Work) 0.2305
    R-Factor(R-Free) 0.2593
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2915
    Shell Resolution(Low) 10.4048
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1269
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2075
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 10.4048
    Shell Resolution(Low) 36.1011
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 1132
    R-Factor(R-Work) 0.295
    R-Factor(R-Free) 0.3691
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.381
    f_plane_restr 0.008
    f_chiral_restr 0.051
    f_angle_d 1.7
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6917
    Nucleic Acid Atoms 1374
    Heterogen Atoms 50
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building Phaser