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X-RAY DIFFRACTION
Materials and Methods page
3FL8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.8
    Temperature 298.0
    Details 12% PEG 3350, 0.2M CaCl2, 0.1M MES, 3% glycerol, pH 5.8, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.18 α = 90
    b = 135.92 β = 90
    c = 168.65 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type Bruker Platinum 135
    Details Montel multilayer
    Collection Date 2008-05-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type BRUKER AXS MICROSTAR
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.29
    Resolution(Low) 25
    Number Reflections(All) 71501
    Number Reflections(Observed) 69571
    Percent Possible(Observed) 97.3
    B(Isotropic) From Wilson Plot 31.4
    Redundancy 13.7
     
    High Resolution Shell Details
    Resolution(High) 2.288
    Resolution(Low) 2.4
    Percent Possible(All) 96.7
    Mean I Over Sigma(Observed) 4.8
    R-Sym I(Observed) 0.476
    Redundancy 11.2
    Number Unique Reflections(All) 8056
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2881
    Resolution(Low) 24.972
    Cut-off Sigma(F) 0.04
    Number of Reflections(Observed) 69571
    Number of Reflections(R-Free) 3513
    Percent Reflections(Observed) 97.33
    R-Factor(Observed) 0.209
    R-Work 0.206
    R-Free 0.254
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 29.282
    Anisotropic B[1][1] 5.921
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.876
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.797
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2881
    Shell Resolution(Low) 2.3194
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2045
    R-Factor(R-Work) 0.2668
    R-Factor(R-Free) 0.3122
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3194
    Shell Resolution(Low) 2.3525
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.2479
    R-Factor(R-Free) 0.321
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3525
    Shell Resolution(Low) 2.3876
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.239
    R-Factor(R-Free) 0.3185
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3876
    Shell Resolution(Low) 2.4249
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2336
    R-Factor(R-Free) 0.3356
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4249
    Shell Resolution(Low) 2.4646
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.2321
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4646
    Shell Resolution(Low) 2.5071
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.2277
    R-Factor(R-Free) 0.2758
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5071
    Shell Resolution(Low) 2.5526
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.2383
    R-Factor(R-Free) 0.3089
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5526
    Shell Resolution(Low) 2.6017
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.2466
    R-Factor(R-Free) 0.3012
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6017
    Shell Resolution(Low) 2.6547
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2403
    R-Factor(R-Free) 0.3275
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6547
    Shell Resolution(Low) 2.7124
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.2315
    R-Factor(R-Free) 0.3076
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7124
    Shell Resolution(Low) 2.7754
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7754
    Shell Resolution(Low) 2.8447
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.2214
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8447
    Shell Resolution(Low) 2.9215
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.2165
    R-Factor(R-Free) 0.2732
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9215
    Shell Resolution(Low) 3.0074
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.2798
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0074
    Shell Resolution(Low) 3.1043
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2535
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1043
    Shell Resolution(Low) 3.215
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.2051
    R-Factor(R-Free) 0.2562
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.215
    Shell Resolution(Low) 3.3434
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2616
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3434
    Shell Resolution(Low) 3.4952
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1971
    R-Factor(R-Free) 0.2473
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4952
    Shell Resolution(Low) 3.6789
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6789
    Shell Resolution(Low) 3.9086
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9086
    Shell Resolution(Low) 4.2091
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1593
    R-Factor(R-Free) 0.199
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2091
    Shell Resolution(Low) 4.6302
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6302
    Shell Resolution(Low) 5.2947
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.1433
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2947
    Shell Resolution(Low) 6.6498
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2785
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.2042
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6498
    Shell Resolution(Low) 24.974
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2855
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.1992
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.819
    f_plane_restr 0.006
    f_chiral_restr 0.064
    f_angle_d 1.051
    f_bond_d 0.007
     
    Coordinate Error
    Luzzati ESD(Observed) 0.286
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10791
    Nucleic Acid Atoms 0
    Heterogen Atoms 296
    Solvent Atoms 1521
     
     
  •   Software and Computing Hide
    Computing
    Data Collection PROTEUM PLUS
    Data Reduction (intensity integration) SAINT
    Data Reduction (data scaling) SADABS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building Phaser
    data collection PROTEUM version: PLUS