X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.8 α = 90
b = 56.11 β = 106.47
c = 85.24 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate mirrors 1999-05-29
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 0.98 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.53 18.8 70.2 0.038 0.038 -- 3.0 101134 92759 -- 2.0 12.42
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.53 1.57 41.4 0.195 0.195 5.15 2.1 3111

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.53 18.804 -- 1.99 -- 92759 2319 91.85 -- 0.1955 0.1938 0.2612 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.53 1.5612 -- 126 4935 0.1997 0.2536 -- 85.0
X Ray Diffraction 1.5612 1.5951 -- 132 5126 0.1947 0.3125 -- 89.0
X Ray Diffraction 1.5951 1.6322 -- 136 5295 0.1914 0.2624 -- 92.0
X Ray Diffraction 1.6322 1.673 -- 139 5430 0.1765 0.2608 -- 94.0
X Ray Diffraction 1.673 1.7182 -- 142 5529 0.1641 0.2622 -- 96.0
X Ray Diffraction 1.7182 1.7688 -- 143 5589 0.159 0.233 -- 97.0
X Ray Diffraction 1.7688 1.8258 -- 146 5673 0.1598 0.2513 -- 98.0
X Ray Diffraction 1.8258 1.891 -- 143 5584 0.195 0.2963 -- 96.0
X Ray Diffraction 1.891 1.9666 -- 144 5618 0.2131 0.269 -- 98.0
X Ray Diffraction 1.9666 2.056 -- 148 5759 0.179 0.2504 -- 99.0
X Ray Diffraction 2.056 2.1643 -- 147 5767 0.1589 0.235 -- 100.0
X Ray Diffraction 2.1643 2.2997 -- 73 2815 0.1734 0.273 -- 49.0
X Ray Diffraction 2.2997 2.4769 -- 146 5719 0.1612 0.2387 -- 99.0
X Ray Diffraction 2.4769 2.7254 -- 147 5738 0.1733 0.2177 -- 98.0
X Ray Diffraction 2.7254 3.1183 -- 147 5718 0.1813 0.2511 -- 98.0
X Ray Diffraction 3.1183 3.9228 -- 128 4992 0.1982 0.2269 -- 85.0
X Ray Diffraction 3.9228 18.8059 -- 132 5153 0.26 0.3253 -- 86.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.005
f_angle_d 0.863
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5536
Nucleic Acid Atoms 0
Heterogen Atoms 7
Solvent Atoms 1063

Software

Software
Software Name Purpose
MAR345dtb data collection
MOLREP phasing
PHENIX refinement version: (phenix.refine)
XDS data reduction
XDS data scaling