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X-RAY DIFFRACTION
Materials and Methods page
3FI5
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.8 α = 90
    b = 56.11 β = 106.47
    c = 85.24 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 345 mm plate
    Details mirrors
    Collection Date 1999-05-29
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-1
    Wavelength List 0.98
    Site SSRL
    Beamline BL9-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.53
    Resolution(Low) 18.8
    Number Reflections(All) 101134
    Number Reflections(Observed) 92759
    Percent Possible(Observed) 70.2
    R Merge I(Observed) 0.038
    B(Isotropic) From Wilson Plot 12.42
    Redundancy 3.0
     
    High Resolution Shell Details
    Resolution(High) 1.53
    Resolution(Low) 1.57
    Percent Possible(All) 41.4
    R Merge I(Observed) 0.195
    Mean I Over Sigma(Observed) 5.15
    R-Sym I(Observed) 0.195
    Redundancy 2.1
    Number Unique Reflections(All) 3111
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.53
    Resolution(Low) 18.804
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 92759
    Number of Reflections(R-Free) 2319
    Percent Reflections(Observed) 91.85
    R-Factor(Observed) 0.1955
    R-Work 0.1938
    R-Free 0.2612
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.53
    Shell Resolution(Low) 1.5612
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 4935
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2536
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5612
    Shell Resolution(Low) 1.5951
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 5126
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.3125
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5951
    Shell Resolution(Low) 1.6322
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 5295
    R-Factor(R-Work) 0.1914
    R-Factor(R-Free) 0.2624
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6322
    Shell Resolution(Low) 1.673
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 5430
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2608
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.673
    Shell Resolution(Low) 1.7182
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5529
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.2622
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7182
    Shell Resolution(Low) 1.7688
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5589
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7688
    Shell Resolution(Low) 1.8258
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 5673
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.2513
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8258
    Shell Resolution(Low) 1.891
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5584
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.891
    Shell Resolution(Low) 1.9666
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5618
    R-Factor(R-Work) 0.2131
    R-Factor(R-Free) 0.269
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9666
    Shell Resolution(Low) 2.056
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 5759
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.056
    Shell Resolution(Low) 2.1643
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 5767
    R-Factor(R-Work) 0.1589
    R-Factor(R-Free) 0.235
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1643
    Shell Resolution(Low) 2.2997
    Number of Reflections(R-Free) 73
    Number of Reflections(R-Work) 2815
    R-Factor(R-Work) 0.1734
    R-Factor(R-Free) 0.273
    Percent Reflections(Observed) 49.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2997
    Shell Resolution(Low) 2.4769
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 5719
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.2387
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4769
    Shell Resolution(Low) 2.7254
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 5738
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2177
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7254
    Shell Resolution(Low) 3.1183
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 5718
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2511
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1183
    Shell Resolution(Low) 3.9228
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 4992
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2269
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9228
    Shell Resolution(Low) 18.8059
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 5153
    R-Factor(R-Work) 0.26
    R-Factor(R-Free) 0.3253
    Percent Reflections(Observed) 86.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_angle_d 0.863
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5231
    Nucleic Acid Atoms 0
    Heterogen Atoms 11
    Solvent Atoms 995
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution MolRep
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building MolRep
    data collection MAR345dtb