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X-RAY DIFFRACTION
Materials and Methods page
3FEX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 291.0
    Details 100 mM KCl, 12% PEG 8000, 100 mM Tris-HCl pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.51 α = 90
    b = 102.05 β = 108.82
    c = 107.88 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Details Mirror
    Collection Date 2007-07-04
     
    Diffraction Radiation
    Monochromator Horizontal bHorizontal bent Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.9179
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.5
    Resolution(Low) 15.65
    Number Reflections(All) 19814
    Number Reflections(Observed) 18110
    Percent Possible(Observed) 91.4
    R Merge I(Observed) 0.161
    B(Isotropic) From Wilson Plot 74.05
    Redundancy 2.9
     
    High Resolution Shell Details
    Resolution(High) 3.5
    Resolution(Low) 3.62
    Percent Possible(All) 92.5
    R Merge I(Observed) 0.428
    Mean I Over Sigma(Observed) 2.58
    R-Sym I(Observed) 0.428
    Redundancy 2.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.549
    Resolution(Low) 15.652
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 20643
    Number of Reflections(Observed) 18063
    Number of Reflections(R-Free) 927
    Percent Reflections(Observed) 87.5
    R-Factor(Observed) 0.2212
    R-Work 0.2173
    R-Free 0.2924
     
    Temperature Factor Modeling
    Isotropic Thermal Model Group ADP
    Anisotropic B[1][1] 8.4226
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -4.846
    Anisotropic B[2][2] -0.9607
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.4619
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.549
    Shell Resolution(Low) 3.7341
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 1884
    R-Factor(R-Work) 0.2593
    R-Factor(R-Free) 0.3125
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7341
    Shell Resolution(Low) 3.9645
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.2352
    R-Factor(R-Free) 0.3419
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9645
    Shell Resolution(Low) 4.2649
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.2172
    R-Factor(R-Free) 0.2981
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2649
    Shell Resolution(Low) 4.6836
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.2844
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6836
    Shell Resolution(Low) 5.3377
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2505
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.2657
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3377
    Shell Resolution(Low) 6.6384
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.3322
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6384
    Shell Resolution(Low) 15.6525
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2517
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2387
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.032
    f_dihedral_angle_d 12.477
    f_angle_d 0.549
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10051
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building MOLREP
    data collection HKL-2000