X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.7
Temperature 277.0
Details 2 M Na/K phosphate, pH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.37 α = 90
b = 60.37 β = 90
c = 96.57 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate -- 1999-01-21
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 0.9800 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.09 28 92.35 0.57 0.57 -- 2.7 78959 64093 4.0 2.0 13.5
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.09 1.12 89.6 0.35 0.35 2.2 2.4 5557

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
AB INITIO 1.09 28.0 -- 4.0 78959 60825 3964 92.4 0.1639 0.1576 0.1485 0.1883 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.09 1.12 -- -- -- -- -- -- --
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.094
s_similar_adp_cmpnt 0.046
s_rigid_bond_adp_cmpnt 0.006
s_anti_bump_dis_restr 0.045
s_non_zero_chiral_vol 0.079
s_zero_chiral_vol 0.08
s_from_restr_planes 0.0245
s_similar_dist 0.0
s_angle_d 0.029
s_bond_d 0.015
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.06
Number Disordered Residues 22.0
Occupancy Sum Hydrogen 1273.9
Occupancy Sum Non Hydrogen 1510.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1288
Nucleic Acid Atoms 0
Heterogen Atoms 25
Solvent Atoms 218

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
MOSFLM Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
SHELX Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
MAR345dtb data collection