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X-RAY DIFFRACTION
Materials and Methods page
3F9L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.7
    Temperature 277.0
    Details 2M Na/K Phosphate, pH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.19 α = 90
    b = 60.19 β = 90
    c = 96.74 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 345 mm plate
    Collection Date 2002-02-07
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-1
    Wavelength List 0.82653
    Site SSRL
    Beamline BL9-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 4.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.19
    Resolution(Low) 20
    Number Reflections(All) 58461
    Number Reflections(Observed) 50477
    Percent Possible(Observed) 89.0
    R Merge I(Observed) 0.38
    B(Isotropic) From Wilson Plot 14.4
    Redundancy 4.7
     
    High Resolution Shell Details
    Resolution(High) 1.19
    Resolution(Low) 1.24
    Percent Possible(All) 88.9
    R Merge I(Observed) 0.21
    Mean I Over Sigma(Observed) 3.6
    R-Sym I(Observed) 0.36
    Redundancy 3.5
    Number Unique Reflections(All) 5496
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method AB INITIO
    reflnsShellList 1.19
    Resolution(Low) 20.0
    Cut-off Sigma(I) 4.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 58461
    Number of Reflections(Observed) 50477
    Number of Reflections(R-Free) 2873
    Percent Reflections(Observed) 89.0
    R-Factor(All) 0.1573
    R-Factor(Observed) 0.148
    R-Work 0.1519
    R-Free 0.1892
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.19
    Shell Resolution(Low) 1.24
    Percent Reflections(Observed) 70.7
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    s_approx_iso_adps 0.088
    s_similar_adp_cmpnt 0.047
    s_rigid_bond_adp_cmpnt 0.005
    s_anti_bump_dis_restr 0.027
    s_non_zero_chiral_vol 0.073
    s_zero_chiral_vol 0.069
    s_from_restr_planes 0.0246
    s_similar_dist 0.0
    s_angle_d 0.029
    s_bond_d 0.021
     
    Coordinate Error
    Luzzati ESD(Observed) 0.06
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1289
    Nucleic Acid Atoms 0
    Heterogen Atoms 9
    Solvent Atoms 244
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution SHELX
    Structure Refinement SHELXL-97
     
    Software
    refinement SHELXL-97
    model building SHELX
    data collection MAR345dtb