X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.7
Temperature 277.0
Details 2M Na/K Phosphate, pH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.19 α = 90
b = 60.19 β = 90
c = 96.74 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate -- 2002-02-07
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 0.82653 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.19 20 89.0 0.38 0.38 -- 4.7 58461 50477 4.0 2.0 14.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.19 1.24 88.9 0.21 0.36 3.6 3.5 5496

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
AB INITIO 1.19 20.0 4.0 2.0 58461 50477 2873 89.0 0.1573 0.148 0.1519 0.1892 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.19 1.24 -- -- -- -- -- -- 70.7
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.088
s_similar_adp_cmpnt 0.047
s_rigid_bond_adp_cmpnt 0.005
s_anti_bump_dis_restr 0.027
s_non_zero_chiral_vol 0.073
s_zero_chiral_vol 0.069
s_from_restr_planes 0.0246
s_similar_dist 0.0
s_angle_d 0.029
s_bond_d 0.021
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.06
Number Disordered Residues 21.0
Occupancy Sum Hydrogen 1281.0
Occupancy Sum Non Hydrogen 1507.35
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1289
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 244

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
MOSFLM Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
SHELX Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
MAR345dtb data collection