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X-RAY DIFFRACTION
Materials and Methods page
3F8V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.3
    Temperature 277.0
    Details 2 M Na/K Phosphate, pH 6.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.12 α = 90
    b = 60.12 β = 90
    c = 95.44 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 345 mm plate
    Collection Date 1999-07-08
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-1
    Wavelength List 1.08
    Site SSRL
    Beamline BL9-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 4.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.08
    Resolution(Low) 17.9
    Number Reflections(All) 85136
    Number Reflections(Observed) 72503
    Percent Possible(Observed) 99.5
    B(Isotropic) From Wilson Plot 10.4
    Redundancy 4.9
     
    High Resolution Shell Details
    Resolution(High) 1.08
    Resolution(Low) 1.14
    Percent Possible(All) 99.5
    Mean I Over Sigma(Observed) 4.3
    R-Sym I(Observed) 0.23
    Redundancy 3.4
    Number Unique Reflections(All) 11790
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method AB INITIO
    reflnsShellList 1.08
    Resolution(Low) 17.9
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 85136
    Number of Reflections(Observed) 72503
    Number of Reflections(R-Free) 4242
    Percent Reflections(Observed) 99.5
    R-Factor(All) 0.1435
    R-Factor(Observed) 0.138
    R-Work 0.1289
    R-Free 0.163
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.08
    Shell Resolution(Low) 1.14
    Number of Reflections(Observed) 11790
    Percent Reflections(Observed) 96.58
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    s_approx_iso_adps 0.1
    s_similar_adp_cmpnt 0.049
    s_rigid_bond_adp_cmpnt 0.006
    s_anti_bump_dis_restr 0.038
    s_non_zero_chiral_vol 0.074
    s_zero_chiral_vol 0.071
    s_from_restr_planes 0.0237
    s_similar_dist 0.0
    s_angle_d 0.029
    s_bond_d 0.015
     
    Coordinate Error
    Luzzati ESD(Observed) 0.06
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1308
    Nucleic Acid Atoms 0
    Heterogen Atoms 17
    Solvent Atoms 242
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution SHELX
    Structure Refinement SHELXL-97
     
    Software
    refinement SHELXL-97
    model building SHELX
    data collection MAR345dtb