X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.3
Temperature 277.0
Details 2 M Na/K Phosphate, pH 6.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.12 α = 90
b = 60.12 β = 90
c = 95.44 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate -- 1999-07-08
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 1.08 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.08 17.9 99.5 -- 0.038 -- 4.9 85136 72503 4.0 2.0 10.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.08 1.14 99.5 -- 0.23 4.3 3.4 11790

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
AB INITIO 1.08 17.9 -- 0.0 85136 72503 4242 99.5 0.1435 0.138 0.1289 0.163 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.08 1.14 11790 -- -- -- -- -- 96.58
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.1
s_similar_adp_cmpnt 0.049
s_rigid_bond_adp_cmpnt 0.006
s_anti_bump_dis_restr 0.038
s_non_zero_chiral_vol 0.074
s_zero_chiral_vol 0.071
s_from_restr_planes 0.0237
s_similar_dist 0.0
s_angle_d 0.029
s_bond_d 0.015
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.06
Number Disordered Residues 19.0
Occupancy Sum Hydrogen 1264.5
Occupancy Sum Non Hydrogen 1535.05
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1308
Nucleic Acid Atoms 0
Heterogen Atoms 17
Solvent Atoms 242

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
MOSFLM Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
SHELX Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
MAR345dtb data collection