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X-RAY DIFFRACTION
Materials and Methods page
3F7T
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details 1.6 M Potassium Phosphate, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.47 α = 90
    b = 83.47 β = 90
    c = 215.45 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Details SILICON OPTICS
    Collection Date 2007-08-19
     
    Diffraction Radiation
    Monochromator double bounce Si(111)
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 1.0,1.7368
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.8
    Resolution(Low) 40
    Number Reflections(All) 78209
    Number Reflections(Observed) 78209
    Percent Possible(Observed) 98.4
    R Merge I(Observed) 0.075
    B(Isotropic) From Wilson Plot 35.16
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.91
    Percent Possible(All) 96.0
    R Merge I(Observed) 0.351
    Mean I Over Sigma(Observed) 2.5
    Redundancy 3.1
    Number Unique Reflections(All) 10654
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.8
    Resolution(Low) 15.0
    Cut-off Sigma(I) 2.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 78122
    Number of Reflections(Observed) 74151
    Number of Reflections(R-Free) 3898
    Percent Reflections(Observed) 98.06
    R-Factor(All) 0.2
    R-Factor(Observed) 0.201
    R-Work 0.19898
    R-Free 0.23823
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 35.156
    Anisotropic B[1][1] 0.34
    Anisotropic B[1][2] 0.17
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.34
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.52
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.847
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 4143
    R-Factor(R-Work) 0.326
    R-Factor(R-Free) 0.367
    Percent Reflections(Observed) 73.75
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.377
    r_scbond_it 2.727
    r_mcangle_it 1.468
    r_mcbond_it 0.946
    r_symmetry_hbond_refined 0.177
    r_bond_refined_d 0.015
    r_angle_refined_deg 1.784
    r_dihedral_angle_1_deg 5.729
    r_dihedral_angle_2_deg 39.375
    r_dihedral_angle_3_deg 19.619
    r_dihedral_angle_4_deg 20.569
    r_chiral_restr 0.354
    r_gen_planes_refined 0.007
    r_nbd_refined 0.205
    r_nbtor_refined 0.31
    r_xyhbond_nbd_refined 0.159
    r_symmetry_vdw_refined 0.275
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4780
    Nucleic Acid Atoms 0
    Heterogen Atoms 72
    Solvent Atoms 428
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution SHARP
    Structure Refinement REFMAC 5.2.0019
     
    Software
    refinement REFMAC version: 5.2.0019
    model building SHARP
    data collection XDS