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X-RAY DIFFRACTION
Materials and Methods page
3F3W
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 10% PEG 20000, 15% glycerol, 85mM MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.06 α = 78.7
    b = 63.69 β = 87.02
    c = 75.12 γ = 89.96
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 90
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details Dynamically bendable mirror
    Collection Date 2008-09-02
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 1.004730
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 40
    Number Reflections(All) 23507
    Number Reflections(Observed) 23074
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.066
    B(Isotropic) From Wilson Plot 39.548
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.7
    Percent Possible(All) 97.4
    R Merge I(Observed) 0.27
    Mean I Over Sigma(Observed) 5.7
    Number Unique Reflections(All) 2506
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 40.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 23507
    Number of Reflections(Observed) 23072
    Number of Reflections(R-Free) 923
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.223
    R-Work 0.221
    R-Free 0.277
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.864
    Anisotropic B[1][1] 0.66
    Anisotropic B[1][2] -0.59
    Anisotropic B[1][3] 0.2
    Anisotropic B[2][2] -0.91
    Anisotropic B[2][3] 0.24
    Anisotropic B[3][3] 0.14
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.667
    Number of Reflections(Observed) 1624
    Number of Reflections(R-Free) 67
    Number of Reflections(R-Work) 1624
    R-Factor(R-Work) 0.304
    R-Factor(R-Free) 0.404
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.31
    r_scbond_it 2.135
    r_mcangle_it 1.455
    r_mcbond_it 0.866
    r_symmetry_hbond_refined 0.192
    r_bond_refined_d 0.019
    r_angle_refined_deg 1.865
    r_dihedral_angle_1_deg 7.202
    r_dihedral_angle_2_deg 39.853
    r_dihedral_angle_3_deg 19.159
    r_dihedral_angle_4_deg 19.02
    r_chiral_restr 0.122
    r_gen_planes_refined 0.007
    r_nbd_refined 0.243
    r_nbtor_refined 0.321
    r_xyhbond_nbd_refined 0.211
    r_symmetry_vdw_refined 0.289
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4159
    Nucleic Acid Atoms 0
    Heterogen Atoms 76
    Solvent Atoms 73
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.2.0005
     
    Software
    data extraction pdb_extract version: 3.006
    refinement REFMAC5
    molecular replacement Phaser
    data processing Xscale