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X-RAY DIFFRACTION
Materials and Methods page
3F3V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 10% PEG 20000, 15% glycerol, 85 mM MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.06 α = 79.06
    b = 63.4 β = 87.72
    c = 74.96 γ = 90.08
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 90
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details Dynamically bendable mirror
    Collection Date 2008-07-20
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 1.000000
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 40
    Number Reflections(All) 23389
    Number Reflections(Observed) 21983
    Percent Possible(Observed) 94.0
    R Merge I(Observed) 0.077
    B(Isotropic) From Wilson Plot 38.29
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.7
    Percent Possible(All) 92.5
    R Merge I(Observed) 0.221
    Mean I Over Sigma(Observed) 6.2
    Number Unique Reflections(All) 2324
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 40.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 23389
    Number of Reflections(Observed) 21983
    Number of Reflections(R-Free) 880
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.213
    R-Work 0.21
    R-Free 0.284
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 23.622
    Anisotropic B[1][1] 0.89
    Anisotropic B[1][2] -0.34
    Anisotropic B[1][3] 0.4
    Anisotropic B[2][2] -1.09
    Anisotropic B[2][3] 0.19
    Anisotropic B[3][3] 0.09
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.667
    Number of Reflections(Observed) 1543
    Number of Reflections(R-Free) 65
    Number of Reflections(R-Work) 1543
    R-Factor(R-Work) 0.372
    R-Factor(R-Free) 0.421
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.5
    r_scbond_it 2.279
    r_mcangle_it 1.573
    r_mcbond_it 0.927
    r_symmetry_hbond_refined 0.16
    r_bond_refined_d 0.018
    r_angle_refined_deg 1.893
    r_dihedral_angle_1_deg 7.443
    r_dihedral_angle_2_deg 39.203
    r_dihedral_angle_3_deg 20.607
    r_dihedral_angle_4_deg 18.744
    r_chiral_restr 0.126
    r_gen_planes_refined 0.007
    r_nbd_refined 0.245
    r_nbtor_refined 0.325
    r_xyhbond_nbd_refined 0.203
    r_symmetry_vdw_refined 0.33
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4143
    Nucleic Acid Atoms 0
    Heterogen Atoms 76
    Solvent Atoms 53
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.2.0005
     
    Software
    data extraction pdb_extract version: 3.006
    refinement REFMAC5
    molecular replacement Phaser
    data processing Xscale