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X-RAY DIFFRACTION
Materials and Methods page
3F1P
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion combined with microseeding
    pH 6.5
    Temperature 293.0
    Details 30% PEG3350, 0.1M BisTris, 0.05M Tris, 0.017M NaCl, 0.005M DTT, pH 6.5, vapor diffusion combined with microseeding, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.92 α = 90
    b = 82.57 β = 106.02
    c = 41.03 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2007-12-15
     
    Diffraction Radiation
    Monochromator Custom
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97904
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.17
    Resolution(Low) 26.93
    Number Reflections(Observed) 76140
    Percent Possible(Observed) 95.8
    R Merge I(Observed) 0.068
    B(Isotropic) From Wilson Plot 11.46
    Redundancy 4.7
     
    High Resolution Shell Details
    Resolution(High) 1.17
    Resolution(Low) 1.18
    Percent Possible(All) 64.3
    R Merge I(Observed) 0.369
    Mean I Over Sigma(Observed) 2.1
    Redundancy 1.3
    Number Unique Reflections(All) 1679
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.17
    Resolution(Low) 26.926
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 76140
    Number of Reflections(Observed) 75655
    Number of Reflections(R-Free) 1523
    Percent Reflections(Observed) 95.14
    R-Factor(Observed) 0.1412
    R-Work 0.1407
    R-Free 0.1665
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model individual anisotropic B values
    Mean Isotropic B Value 18.9
    Anisotropic B[1][1] 1.9921
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.7563
    Anisotropic B[2][2] -1.6678
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.3244
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.17
    Shell Resolution(Low) 1.2078
    Number of Reflections(Observed) 5092
    Number of Reflections(R-Free) 104
    Number of Reflections(R-Work) 4988
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2196
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2078
    Shell Resolution(Low) 1.2509
    Number of Reflections(Observed) 6730
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6585
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2509
    Shell Resolution(Low) 1.301
    Number of Reflections(Observed) 6928
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 6810
    R-Factor(R-Work) 0.1437
    R-Factor(R-Free) 0.1989
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.301
    Shell Resolution(Low) 1.3602
    Number of Reflections(Observed) 7007
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 6881
    R-Factor(R-Work) 0.1302
    R-Factor(R-Free) 0.1748
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3602
    Shell Resolution(Low) 1.432
    Number of Reflections(Observed) 6953
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6814
    R-Factor(R-Work) 0.1232
    R-Factor(R-Free) 0.1421
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.432
    Shell Resolution(Low) 1.5217
    Number of Reflections(Observed) 7044
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 6884
    R-Factor(R-Work) 0.1189
    R-Factor(R-Free) 0.1358
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5217
    Shell Resolution(Low) 1.6391
    Number of Reflections(Observed) 7058
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 6940
    R-Factor(R-Work) 0.1094
    R-Factor(R-Free) 0.1545
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6391
    Shell Resolution(Low) 1.8041
    Number of Reflections(Observed) 7089
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 6935
    R-Factor(R-Work) 0.1127
    R-Factor(R-Free) 0.1381
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8041
    Shell Resolution(Low) 2.065
    Number of Reflections(Observed) 7194
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 7056
    R-Factor(R-Work) 0.1216
    R-Factor(R-Free) 0.1787
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.065
    Shell Resolution(Low) 2.6014
    Number of Reflections(Observed) 7245
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 7104
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.1539
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6014
    Shell Resolution(Low) 26.9336
    Number of Reflections(Observed) 7315
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 7135
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.1692
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_planarity_d 0.009
    f_dihedral_angle_d 16.02
    f_improper_angle_d 0.136
    f_angle_deg 1.368
    f_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1849
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 257
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Custom
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution Phaser
    Structure Refinement PHENIX 1.3
     
    Software
    refinement PHENIX version: 1.3
    model building Phaser
    data collection Custom