X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Combined with Microseeding
pH 6.5
Temperature 293.0
Details 30% PEG3350, 0.1M BisTris, 0.05M Tris, 0.017M NaCl, 0.005M DTT, pH 6.5, vapor diffusion combined with microseeding, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.92 α = 90
b = 82.57 β = 106.02
c = 41.03 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2007-12-15
Diffraction Radiation
Monochromator Protocol
Custom SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97904 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.17 26.93 95.8 0.068 -- -- 4.7 -- 76140 -3.0 -3.0 11.46
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.17 1.18 64.3 0.369 -- 2.1 1.3 1679

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.17 26.926 -- 1.33 76140 75655 1523 95.14 -- 0.1412 0.1407 0.1665 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.17 1.2078 5092 104 4988 0.1796 0.2196 -- 70.0
X Ray Diffraction 1.2078 1.2509 6730 145 6585 0.1685 0.2061 -- 94.0
X Ray Diffraction 1.2509 1.301 6928 118 6810 0.1437 0.1989 -- 96.0
X Ray Diffraction 1.301 1.3602 7007 126 6881 0.1302 0.1748 -- 97.0
X Ray Diffraction 1.3602 1.432 6953 139 6814 0.1232 0.1421 -- 97.0
X Ray Diffraction 1.432 1.5217 7044 160 6884 0.1189 0.1358 -- 97.0
X Ray Diffraction 1.5217 1.6391 7058 118 6940 0.1094 0.1545 -- 98.0
X Ray Diffraction 1.6391 1.8041 7089 154 6935 0.1127 0.1381 -- 98.0
X Ray Diffraction 1.8041 2.065 7194 138 7056 0.1216 0.1787 -- 99.0
X Ray Diffraction 2.065 2.6014 7245 141 7104 0.134 0.1539 -- 100.0
X Ray Diffraction 2.6014 26.9336 7315 180 7135 0.1599 0.1692 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model individual anisotropic B values
Mean Isotropic B 18.9
Anisotropic B[1][1] 1.9921
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.7563
Anisotropic B[2][2] -1.6678
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.3244
RMS Deviations
Key Refinement Restraint Deviation
f_planarity_d 0.009
f_dihedral_angle_d 16.02
f_improper_angle_d 0.136
f_angle_deg 1.368
f_bond_d 0.015
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1849
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 257

Software

Computing
Computing Package Purpose
Custom Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX 1.3 Structure Refinement
Software
Software Name Purpose
PHENIX version: 1.3 refinement
Phaser model building
Custom data collection