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X-RAY DIFFRACTION
Materials and Methods page
3F1O
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion combined with microseeding
    pH 6.5
    Temperature 293.0
    Details 30% PEG 3350, 0.1M BisTris, 0.05M Tris, 0.017M NaCl, 0.005M DTT , pH 6.5, vapor diffusion combined with microseeding, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.76 α = 90
    b = 83.02 β = 106.36
    c = 41.55 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type SBC-2
    Collection Date 2007-06-22
     
    Diffraction Radiation
    Monochromator Custom
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-BM
    Wavelength List 0.97934
    Site APS
    Beamline 19-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.6
    Resolution(Low) 26.93
    Number Reflections(All) 31184
    Number Reflections(Observed) 31184
    Percent Possible(Observed) 98.4
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 17.93
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.61
    Percent Possible(All) 97.7
    R Merge I(Observed) 0.488
    Mean I Over Sigma(Observed) 2.1
    Redundancy 3.5
    Number Unique Reflections(All) 732
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.598
    Resolution(Low) 26.93
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 31184
    Number of Reflections(Observed) 31173
    Number of Reflections(R-Free) 1581
    Percent Reflections(Observed) 98.08
    R-Factor(Observed) 0.1683
    R-Work 0.1663
    R-Free 0.2033
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
    Mean Isotropic B Value 23.21
    Anisotropic B[1][1] 4.4362
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.3278
    Anisotropic B[2][2] -1.3044
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.1318
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5978
    Shell Resolution(Low) 1.6493
    Number of Reflections(Observed) 2677
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.2021
    R-Factor(R-Free) 0.2368
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6493
    Shell Resolution(Low) 1.7083
    Number of Reflections(Observed) 2827
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1808
    R-Factor(R-Free) 0.241
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7083
    Shell Resolution(Low) 1.7767
    Number of Reflections(Observed) 2794
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7767
    Shell Resolution(Low) 1.8575
    Number of Reflections(Observed) 2838
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.2089
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8575
    Shell Resolution(Low) 1.9554
    Number of Reflections(Observed) 2802
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.1527
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9554
    Shell Resolution(Low) 2.0779
    Number of Reflections(Observed) 2859
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1541
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0779
    Shell Resolution(Low) 2.2382
    Number of Reflections(Observed) 2852
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1862
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2382
    Shell Resolution(Low) 2.4633
    Number of Reflections(Observed) 2854
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1774
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4633
    Shell Resolution(Low) 2.8195
    Number of Reflections(Observed) 2866
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.1933
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8195
    Shell Resolution(Low) 3.5509
    Number of Reflections(Observed) 2880
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5509
    Shell Resolution(Low) 26.9336
    Number of Reflections(Observed) 2924
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2758
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.2158
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_planarity_d 0.009
    f_dihedral_angle_d 15.451
    f_improper_angle_d 0.081
    f_angle_deg 1.048
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1812
    Nucleic Acid Atoms 0
    Heterogen Atoms 24
    Solvent Atoms 185
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Custom
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution Phaser
    Structure Refinement PHENIX 1.3
     
    Software
    refinement PHENIX version: 1.3
    model building Phaser
    data collection Custom