X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Combined with Microseeding
pH 6.5
Temperature 293.0
Details 30% PEG 3350, 0.1M BisTris, 0.05M Tris, 0.017M NaCl, 0.005M DTT , pH 6.5, vapor diffusion combined with microseeding, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.76 α = 90
b = 83.02 β = 106.36
c = 41.55 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2007-06-22
Diffraction Radiation
Monochromator Protocol
Custom SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97934 APS 19-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 26.93 98.4 0.05 -- -- 3.7 31184 31184 -3.0 -3.0 17.93
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.61 97.7 0.488 -- 2.1 3.5 732

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.598 26.93 -- 1.36 31184 31173 1581 98.08 -- 0.1683 0.1663 0.2033 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5978 1.6493 2677 136 2541 0.2021 0.2368 -- 94.0
X Ray Diffraction 1.6493 1.7083 2827 139 2688 0.1808 0.241 -- 98.0
X Ray Diffraction 1.7083 1.7767 2794 123 2671 0.1649 0.2041 -- 98.0
X Ray Diffraction 1.7767 1.8575 2838 122 2716 0.1666 0.2089 -- 98.0
X Ray Diffraction 1.8575 1.9554 2802 140 2662 0.1527 0.1775 -- 98.0
X Ray Diffraction 1.9554 2.0779 2859 151 2708 0.1541 0.2074 -- 98.0
X Ray Diffraction 2.0779 2.2382 2852 126 2726 0.1493 0.1862 -- 99.0
X Ray Diffraction 2.2382 2.4633 2854 149 2705 0.1601 0.1774 -- 99.0
X Ray Diffraction 2.4633 2.8195 2866 166 2700 0.1563 0.1933 -- 99.0
X Ray Diffraction 2.8195 3.5509 2880 163 2717 0.1613 0.1888 -- 99.0
X Ray Diffraction 3.5509 26.9336 2924 166 2758 0.1724 0.2158 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 23.21
Anisotropic B[1][1] 4.4362
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 1.3278
Anisotropic B[2][2] -1.3044
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -3.1318
RMS Deviations
Key Refinement Restraint Deviation
f_planarity_d 0.009
f_dihedral_angle_d 15.451
f_improper_angle_d 0.081
f_angle_deg 1.048
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1812
Nucleic Acid Atoms 0
Heterogen Atoms 24
Solvent Atoms 185

Software

Computing
Computing Package Purpose
Custom Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX 1.3 Structure Refinement
Software
Software Name Purpose
PHENIX version: 1.3 refinement
Phaser model building
Custom data collection