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X-RAY DIFFRACTION
Materials and Methods page
3F1N
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion combined with microseeding
    pH 6.5
    Temperature 293.0
    Details 30% PEG 3350, 0.1M BisTris, 0.05M Tris, 0.017M NaCl, 0.005M DTT, pH 6.5, vapor diffusion combined with microseeding, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.32 α = 90
    b = 82.91 β = 106.08
    c = 41.4 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type SBC-2
    Collection Date 2007-04-13
     
    Diffraction Radiation
    Monochromator Custom
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97924
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.48
    Resolution(Low) 31
    Number Reflections(All) 39281
    Number Reflections(Observed) 39281
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.042
    B(Isotropic) From Wilson Plot 17.72
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 1.48
    Resolution(Low) 1.49
    Percent Possible(All) 91.3
    R Merge I(Observed) 0.045
    Mean I Over Sigma(Observed) 1.9
    Redundancy 4.0
    Number Unique Reflections(All) 933
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.479
    Resolution(Low) 30.972
    Cut-off Sigma(F) 1.37
    Number of Reflections(all) 39281
    Number of Reflections(Observed) 39277
    Number of Reflections(R-Free) 1972
    Percent Reflections(Observed) 98.87
    R-Factor(Observed) 0.173
    R-Work 0.1716
    R-Free 0.1994
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic, TLS
    Mean Isotropic B Value 24.4
    Anisotropic B[1][1] 4.4438
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.8903
    Anisotropic B[2][2] -2.095
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.3488
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4786
    Shell Resolution(Low) 1.5155
    Number of Reflections(Observed) 2513
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2392
    R-Factor(R-Work) 0.2358
    R-Factor(R-Free) 0.3062
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5155
    Shell Resolution(Low) 1.5565
    Number of Reflections(Observed) 2736
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5565
    Shell Resolution(Low) 1.6023
    Number of Reflections(Observed) 2839
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1913
    R-Factor(R-Free) 0.2144
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6023
    Shell Resolution(Low) 1.654
    Number of Reflections(Observed) 2826
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.2171
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.654
    Shell Resolution(Low) 1.7131
    Number of Reflections(Observed) 2820
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7131
    Shell Resolution(Low) 1.7817
    Number of Reflections(Observed) 2838
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.2133
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7817
    Shell Resolution(Low) 1.8628
    Number of Reflections(Observed) 2804
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1639
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8628
    Shell Resolution(Low) 1.961
    Number of Reflections(Observed) 2850
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1573
    R-Factor(R-Free) 0.1904
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.961
    Shell Resolution(Low) 2.0838
    Number of Reflections(Observed) 2818
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1886
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0838
    Shell Resolution(Low) 2.2447
    Number of Reflections(Observed) 2832
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.1818
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2447
    Shell Resolution(Low) 2.4705
    Number of Reflections(Observed) 2830
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.183
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4705
    Shell Resolution(Low) 2.8278
    Number of Reflections(Observed) 2851
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.2013
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8278
    Shell Resolution(Low) 3.5619
    Number of Reflections(Observed) 2853
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.1626
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5619
    Shell Resolution(Low) 30.9787
    Number of Reflections(Observed) 2867
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_planarity_d 0.007
    f_dihedral_angle_d 15.348
    f_improper_angle_d 0.097
    f_angle_deg 1.226
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1804
    Nucleic Acid Atoms 0
    Heterogen Atoms 12
    Solvent Atoms 175
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Custom
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution Phaser
    Structure Refinement PHENIX 1.3
     
    Software
    refinement PHENIX version: 1.3
    model building Phaser
    data collection Custom