X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.8
Temperature 298.0
Details 26% PEG 300, 0.1 NaAcetate pH 4.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.64 α = 90
b = 119.49 β = 90
c = 164.01 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2008-06-16
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.31 96.7 98.9 -- -- -- -- 140514 140514 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.31 1.36 94.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.31 96.67 -- 0.0 133473 133473 7033 98.74 0.16 0.16 0.15887 0.16706 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.31 1.345 -- 468 9088 0.236 0.239 -- 91.66
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 22.716
Anisotropic B[1][1] 0.85
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.38
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.48
RMS Deviations
Key Refinement Restraint Deviation
r_sphericity_bonded 1.95
r_sphericity_free 2.055
r_rigid_bond_restr 0.766
r_scangle_it 2.204
r_scbond_it 1.48
r_mcangle_it 0.9
r_mcbond_it 0.541
r_nbd_refined 0.201
r_gen_planes_refined 0.005
r_chiral_restr 0.082
r_dihedral_angle_4_deg 14.1
r_dihedral_angle_3_deg 11.487
r_dihedral_angle_2_deg 34.41
r_dihedral_angle_1_deg 10.298
r_angle_refined_deg 1.171
r_bond_refined_d 0.007
r_nbtor_refined 0.304
r_xyhbond_nbd_refined 0.081
r_metal_ion_refined 0.018
r_symmetry_vdw_refined 0.156
r_symmetry_hbond_refined 0.097
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2482
Nucleic Acid Atoms 0
Heterogen Atoms 23
Solvent Atoms 533

Software

Computing
Computing Package Purpose
Sergui Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
REFMAC 5.2.0019 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.2.0019 refinement
Phaser model building
Sergui data collection