POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
3ELF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.8
    Temperature 298.0
    Details 26% PEG 300, 0.1 NaAcetate pH 4.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.64 α = 90
    b = 119.49 β = 90
    c = 164.01 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2008-06-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.31
    Resolution(Low) 96.7
    Number Reflections(All) 140514
    Number Reflections(Observed) 140514
    Percent Possible(Observed) 98.9
     
    High Resolution Shell Details
    Resolution(High) 1.31
    Resolution(Low) 1.36
    Percent Possible(All) 94.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.31
    Resolution(Low) 96.67
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 133473
    Number of Reflections(Observed) 133473
    Number of Reflections(R-Free) 7033
    Percent Reflections(Observed) 98.74
    R-Factor(All) 0.16
    R-Factor(Observed) 0.16
    R-Work 0.15887
    R-Free 0.16706
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 22.716
    Anisotropic B[1][1] 0.85
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.38
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.48
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.31
    Shell Resolution(Low) 1.345
    Number of Reflections(R-Free) 468
    Number of Reflections(R-Work) 9088
    R-Factor(R-Work) 0.236
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 91.66
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 1.95
    r_sphericity_free 2.055
    r_rigid_bond_restr 0.766
    r_scangle_it 2.204
    r_scbond_it 1.48
    r_mcangle_it 0.9
    r_mcbond_it 0.541
    r_nbd_refined 0.201
    r_gen_planes_refined 0.005
    r_chiral_restr 0.082
    r_dihedral_angle_4_deg 14.1
    r_dihedral_angle_3_deg 11.487
    r_dihedral_angle_2_deg 34.41
    r_dihedral_angle_1_deg 10.298
    r_angle_refined_deg 1.171
    r_bond_refined_d 0.007
    r_nbtor_refined 0.304
    r_xyhbond_nbd_refined 0.081
    r_metal_ion_refined 0.018
    r_symmetry_vdw_refined 0.156
    r_symmetry_hbond_refined 0.097
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2482
    Nucleic Acid Atoms 0
    Heterogen Atoms 23
    Solvent Atoms 533
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Sergui
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.2.0019
     
    Software
    refinement REFMAC version: 5.2.0019
    model building Phaser
    data collection Sergui