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X-RAY DIFFRACTION
Materials and Methods page
3ELB
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 293.0
    Details 20% PEG 3350, 0.2M Mg-Formate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 74.18 α = 90
    b = 74.18 β = 90
    c = 139.72 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details mirrors
    Collection Date 2008-08-21
     
    Diffraction Radiation
    Monochromator double crystal
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength List 0.97981, 0.97969, 0.97201
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(Observed) 26706
    Percent Possible(Observed) 98.6
    R Merge I(Observed) 0.097
    Redundancy 10.3
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.06
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.484
    Mean I Over Sigma(Observed) 3.8
    Redundancy 10.3
    Number Unique Reflections(All) 3912
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.0
    Resolution(Low) 19.74
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 25554
    Number of Reflections(Observed) 25554
    Number of Reflections(R-Free) 1345
    Percent Reflections(Observed) 100.0
    R-Factor(All) 0.19805
    R-Factor(Observed) 0.19805
    R-Work 0.1957
    R-Free 0.24195
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.282
    Anisotropic B[1][1] 0.53
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.53
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.06
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.051
    Number of Reflections(R-Free) 97
    Number of Reflections(R-Work) 1841
    R-Factor(R-Work) 0.239
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.774
    r_scbond_it 2.42
    r_mcangle_it 1.59
    r_mcbond_other 0.18
    r_mcbond_it 0.835
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.005
    r_chiral_restr 0.084
    r_dihedral_angle_4_deg 17.948
    r_dihedral_angle_3_deg 14.616
    r_dihedral_angle_2_deg 36.972
    r_dihedral_angle_1_deg 5.357
    r_angle_other_deg 0.857
    r_angle_refined_deg 1.312
    r_bond_other_d 0.002
    r_bond_refined_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2410
    Nucleic Acid Atoms 0
    Heterogen Atoms 27
    Solvent Atoms 192
     
     
  •   Software and Computing Hide
    Computing
    Data Collection mxcube
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXS
    Structure Refinement REFMAC 5.5.0035
     
    Software
    refinement REFMAC version: 5.5.0035
    model building SHELXS
    data collection mxcube