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X-RAY DIFFRACTION
Materials and Methods page
3EKL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.8
    Temperature 298.0
    Details 26% PEG 300, 0.1 NaAcetate pH 4.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.28 α = 90
    b = 120.23 β = 90
    c = 164.82 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2008-06-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.51
    Resolution(Low) 97.1
    Number Reflections(All) 91761
    Number Reflections(Observed) 91761
    Percent Possible(Observed) 96.5
     
    High Resolution Shell Details
    Resolution(High) 1.51
    Resolution(Low) 1.56
    Percent Possible(All) 89.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.51
    Resolution(Low) 97.1
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 91755
    Number of Reflections(Observed) 91755
    Number of Reflections(R-Free) 4602
    Percent Reflections(Observed) 95.99
    R-Factor(Observed) 0.16674
    R-Work 0.16623
    R-Free 0.17637
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 22.063
    Anisotropic B[1][1] 0.79
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.5
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.29
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.51
    Shell Resolution(Low) 1.549
    Number of Reflections(R-Free) 271
    Number of Reflections(R-Work) 5454
    R-Factor(R-Work) 0.237
    R-Factor(R-Free) 0.268
    Percent Reflections(Observed) 81.77
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.361
    r_scbond_it 1.473
    r_mcangle_it 0.741
    r_mcbond_it 0.42
    r_nbd_refined 0.203
    r_gen_planes_refined 0.005
    r_chiral_restr 0.086
    r_dihedral_angle_4_deg 18.553
    r_dihedral_angle_3_deg 11.39
    r_dihedral_angle_2_deg 34.335
    r_dihedral_angle_1_deg 9.437
    r_angle_refined_deg 1.21
    r_bond_refined_d 0.009
    r_nbtor_refined 0.305
    r_xyhbond_nbd_refined 0.107
    r_metal_ion_refined 0.046
    r_symmetry_vdw_refined 0.175
    r_symmetry_hbond_refined 0.087
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2490
    Nucleic Acid Atoms 0
    Heterogen Atoms 23
    Solvent Atoms 505
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Sergui
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.2.0019
     
    Software
    refinement REFMAC version: 5.2.0019
    model building Phaser
    data collection Sergui