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X-RAY DIFFRACTION
Materials and Methods page
3DLQ
  •   Crystallization Hide
    Crystallization Experiments
    Method hanging drop
    pH 7.5
    Temperature 291.0
    Details 0.9M Sodium Acetate, 1mM Triton X-100, 0.1M HEPES, pH 7.5, hanging drop, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.24 α = 90
    b = 79.24 β = 94.63
    c = 92 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Vertical Collimating Mirror, DCM, Toroidal Focusing Mirror
    Collection Date 2007-08-01
     
    Diffraction Radiation
    Monochromator Double Flat Si(111) Crystal Monochromator with Fixed-exit
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type LNLS BEAMLINE W01B-MX2
    Wavelength List 1.45
    Site LNLS
    Beamline W01B-MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(Observed) 27404
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.106
    Redundancy 2.8
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.97
    Percent Possible(All) 94.8
    R Merge I(Observed) 0.305
    Redundancy 2.4
    Number Unique Reflections(All) 2592
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 19.811
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 27916
    Number of Reflections(Observed) 27377
    Number of Reflections(R-Free) 1375
    Percent Reflections(Observed) 98.07
    R-Factor(All) 0.1946
    R-Factor(Observed) 0.1946
    R-Work 0.1923
    R-Free 0.2361
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
    Mean Isotropic B Value 30.241
    Anisotropic B[1][1] 0.258
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.449
    Anisotropic B[2][2] -0.187
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.071
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.897
    Shell Resolution(Low) 1.965
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2304
    R-Factor(R-Work) 0.242
    R-Factor(R-Free) 0.317
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.965
    Shell Resolution(Low) 2.044
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.044
    Shell Resolution(Low) 2.136
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.136
    Shell Resolution(Low) 2.249
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.235
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.249
    Shell Resolution(Low) 2.39
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.296
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.39
    Shell Resolution(Low) 2.574
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.253
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.574
    Shell Resolution(Low) 2.832
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.832
    Shell Resolution(Low) 3.24
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.24
    Shell Resolution(Low) 4.077
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.077
    Shell Resolution(Low) 19.812
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.215
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.138
    f_plane_restr 0.004
    f_chiral_restr 0.068
    f_angle_d 1.009
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2680
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 309
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    data extraction pdb_extract version: 3.006
    refinement phenix
    data processing HKL