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X-RAY DIFFRACTION
Materials and Methods page
3CPL
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    Temperature 293.0
    Details 0.1M potassium thiocianate, 30% PEG 2000, vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 57.71 α = 99.95
    b = 69.7 β = 111.04
    c = 72.38 γ = 110.48
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV
    Collection Date 2008-01-07
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Wavelength List 1.514
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 32162
    Number Reflections(Observed) 30549
    Percent Possible(Observed) 95.0
    R Merge I(Observed) 0.094
    B(Isotropic) From Wilson Plot 20.343
    Redundancy 2.6
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.6
    Percent Possible(All) 93.9
    R Merge I(Observed) 0.273
    Mean I Over Sigma(Observed) 5.0
    Redundancy 2.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 15.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 30430
    Number of Reflections(R-Free) 3069
    Percent Reflections(Observed) 95.38
    R-Factor(Observed) 0.227
    R-Work 0.22
    R-Free 0.286
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 14.635
    Anisotropic B[1][1] -0.36
    Anisotropic B[1][2] 0.25
    Anisotropic B[1][3] 0.29
    Anisotropic B[2][2] 0.26
    Anisotropic B[2][3] -0.49
    Anisotropic B[3][3] 0.31
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.585
    Number of Reflections(R-Free) 315
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.239
    R-Factor(R-Free) 0.339
    Percent Reflections(Observed) 93.96
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 1.663
    r_scbond_it 1.114
    r_mcangle_it 1.601
    r_mcbond_it 0.915
    r_symmetry_hbond_refined 0.402
    r_bond_refined_d 0.011
    r_angle_refined_deg 1.422
    r_dihedral_angle_1_deg 6.916
    r_dihedral_angle_2_deg 35.26
    r_dihedral_angle_3_deg 21.113
    r_dihedral_angle_4_deg 20.588
    r_chiral_restr 0.094
    r_gen_planes_refined 0.005
    r_nbd_refined 0.274
    r_nbtor_refined 0.33
    r_xyhbond_nbd_refined 0.24
    r_symmetry_vdw_refined 0.342
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6288
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 32
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.2.0019
     
    Software
    data extraction pdb_extract version: 3.005
    refinement REFMAC5
    molecular replacement Phaser
    data processing Xscale