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X-RAY DIFFRACTION
Materials and Methods page
3C32
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 293.0
    Details 20% PEG 4000, 125 mM NaCl, 175 mM Na2(SO4), 100 mM Na cacodylate, 4 mM Kainic acid, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.55 α = 90
    b = 70.55 β = 90
    c = 234.46 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2007-12-14
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL SI-220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.72
    Resolution(Low) 40
    Number Reflections(All) 64353
    Number Reflections(Observed) 64353
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 21.38
    Redundancy 9.6
     
    High Resolution Shell Details
    Resolution(High) 1.72
    Resolution(Low) 1.78
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.498
    Mean I Over Sigma(Observed) 5.1
    Redundancy 9.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 1.72
    Resolution(Low) 37.99
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 60936
    Number of Reflections(Observed) 60936
    Number of Reflections(R-Free) 3258
    Percent Reflections(Observed) 99.92
    R-Factor(All) 0.16732
    R-Factor(Observed) 0.16732
    R-Work 0.16562
    R-Free 0.19836
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.492
    Anisotropic B[1][1] 0.77
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.77
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.53
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.72
    Shell Resolution(Low) 1.763
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 4385
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 99.35
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.863
    r_scbond_it 3.057
    r_mcangle_it 1.869
    r_mcbond_it 1.061
    r_gen_planes_refined 0.009
    r_chiral_restr 0.143
    r_dihedral_angle_4_deg 17.698
    r_dihedral_angle_3_deg 14.671
    r_dihedral_angle_2_deg 33.497
    r_dihedral_angle_1_deg 5.83
    r_angle_refined_deg 1.789
    r_bond_refined_d 0.019
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4042
    Nucleic Acid Atoms 0
    Heterogen Atoms 60
    Solvent Atoms 522
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Difference Fourier with REFMAC 5.4.0066
    Structure Refinement REFMAC 5.4.0066
     
    Software
    refinement REFMAC version: 5.4.0066