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X-RAY DIFFRACTION
Materials and Methods page
3AOK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.02M ADA, 0.75M TARTRATE, 25%GLYCEROL, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 57.77 α = 90
    b = 57.77 β = 90
    c = 150.13 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2010-06-04
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL44XU
    Wavelength 1.0
    Wavelength List 1.0
    Site SPRING-8
    Beamline BL44XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.27
    Resolution(Low) 50
    Number Reflections(Observed) 68167
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.072
    Redundancy 9.1
     
    High Resolution Shell Details
    Resolution(High) 1.27
    Resolution(Low) 1.32
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.328
    Mean I Over Sigma(Observed) 8.3
    Redundancy 8.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method AB INITIO
    reflnsShellList 1.27
    Resolution(Low) 10.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 64442
    Number of Reflections(Observed) 68167
    Number of Reflections(R-Free) 3391
    Percent Reflections(Observed) 95.0
    R-Factor(All) 0.1109
    R-Factor(Observed) 0.1121
    R-Free 0.1479
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.27
    Shell Resolution(Low) 1.32
    Number of Reflections(Observed) 7308
    R-Factor(R-Work) 0.148
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    s_approx_iso_adps 0.111
    s_similar_adp_cmpnt 0.048
    s_rigid_bond_adp_cmpnt 0.005
    s_anti_bump_dis_restr 0.024
    s_non_zero_chiral_vol 0.099
    s_zero_chiral_vol 0.084
    s_from_restr_planes 0.0318
    s_similar_dist 0.0
    s_angle_d 0.033
    s_bond_d 0.015
     
    Coordinate Error
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1557
    Nucleic Acid Atoms 0
    Heterogen Atoms 44
    Solvent Atoms 414
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELX
    Structure Refinement SHELXL-97
     
    Software
    refinement SHELXL-97
    model building SHELX