X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 298.0
Details pH 6.50, VAPOR DIFFUSION, SITTING DROP, temperature 298.00K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 25.19 α = 90
b = 40.21 β = 90
c = 65.66 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 136
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC -- --
Diffraction Radiation
Monochromator Protocol
GRAPHITE --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.38 -- -- -- -- -- -- 58307 11594 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.4 10.0 -- 0.0 -- 11438 -- -- -- 0.197 0.197 0.216 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4 1.46 -- -- 784 0.241 -- -- 64.0
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.007
x_angle_deg 1.42
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 0
Nucleic Acid Atoms 486
Heterogen Atoms 14
Solvent Atoms 160

Software

Software
Software Name Purpose
X-PLOR refinement
ADSC data collection