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X-RAY DIFFRACTION
Materials and Methods page
2ZUO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 288.0
    Details 2.4% PEG 4000, 0.8M sodium chloride, 0.05M lithium sulfate, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 288K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 702.25 α = 90
    b = 383.8 β = 124.69
    c = 598.48 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type Bruker DIP-6040
    Details undulator
    Collection Date 2007-12-24
     
    Diffraction Radiation
    Monochromator Si
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL44XU
    Wavelength List 0.9
    Site SPRING-8
    Beamline BL44XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.5
    Resolution(Low) 204
    Number Reflections(Observed) 1531361
    Percent Possible(Observed) 92.4
    R Merge I(Observed) 0.233
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 3.5
    Resolution(Low) 3.69
    Percent Possible(All) 81.2
    R Merge I(Observed) 0.01076
    Mean I Over Sigma(Observed) 1.2
    R-Sym I(Observed) 0.93
    Redundancy 3.3
    Number Unique Reflections(All) 403666
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.5
    Resolution(Low) 204.0
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 1630860
    Number of Reflections(Observed) 1511765
    Number of Reflections(R-Free) 75370
    Percent Reflections(Observed) 92.7
    R-Work 0.311
    R-Free 0.3304
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 122.4
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5
    Shell Resolution(Low) 3.63
    Number of Reflections(Observed) 126565
    Number of Reflections(R-Free) 6640
    R-Factor(R-Work) 0.4259
    R-Factor(R-Free) 0.4319
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.63
    Shell Resolution(Low) 3.77
    Number of Reflections(Observed) 129609
    Number of Reflections(R-Free) 6753
    R-Factor(R-Work) 0.3856
    R-Factor(R-Free) 0.3961
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.77
    Shell Resolution(Low) 3.94
    Number of Reflections(Observed) 140311
    Number of Reflections(R-Free) 7416
    R-Factor(R-Work) 0.3545
    R-Factor(R-Free) 0.3681
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.94
    Shell Resolution(Low) 4.15
    Number of Reflections(Observed) 146097
    Number of Reflections(R-Free) 7601
    R-Factor(R-Work) 0.3143
    R-Factor(R-Free) 0.3348
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.15
    Shell Resolution(Low) 4.41
    Number of Reflections(Observed) 147871
    Number of Reflections(R-Free) 7738
    R-Factor(R-Work) 0.2888
    R-Factor(R-Free) 0.3125
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.41
    Shell Resolution(Low) 4.75
    Number of Reflections(Observed) 148287
    Number of Reflections(R-Free) 7918
    R-Factor(R-Work) 0.2721
    R-Factor(R-Free) 0.3063
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.75
    Shell Resolution(Low) 5.23
    Number of Reflections(Observed) 148482
    Number of Reflections(R-Free) 7816
    R-Factor(R-Work) 0.2812
    R-Factor(R-Free) 0.3143
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.23
    Shell Resolution(Low) 5.98
    Number of Reflections(Observed) 148568
    Number of Reflections(R-Free) 7853
    R-Factor(R-Work) 0.2952
    R-Factor(R-Free) 0.3248
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.98
    Shell Resolution(Low) 7.54
    Number of Reflections(Observed) 148650
    Number of Reflections(R-Free) 7707
    R-Factor(R-Work) 0.2505
    R-Factor(R-Free) 0.2834
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.54
    Shell Resolution(Low) 204.0
    Number of Reflections(Observed) 151955
    Number of Reflections(R-Free) 7928
    R-Factor(R-Work) 0.3285
    R-Factor(R-Free) 0.3337
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 3.245
    c_dihedral_angle_d 26.417
    c_bond_d 0.01
    c_angle_deg 1.479
     
    Coordinate Error
    Luzzati ESD(Observed) 0.6
    Luzzati Sigma A(Observed) 1.12
    Luzzati Resolution Cutoff(Low) 5.0
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 80652
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MOSFLM
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution DM, RAVE
    Structure Refinement CNS
     
    Software
    refinement CNS
    model building DM
    data collection MOSFLM