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X-RAY DIFFRACTION
Materials and Methods page
2YNS
  •   Crystallization Hide
    Crystallization Experiments
    Details 0.1 M BIS-TRISPROPANE PH 7.0, 15-17% PEG 3350 AND 0.2 M NAF
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.24 α = 90
    b = 141.4 β = 90.17
    c = 73.32 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Details SILICON MIRRORS (ADAPTIVE AND
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength 0.9537
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.1
    Resolution(Low) 19.95
    Number Reflections(Observed) 73652
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.11
    B(Isotropic) From Wilson Plot 32.4
    Redundancy 6.1
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.21
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.91
    Mean I Over Sigma(Observed) 2.1
    Redundancy 5.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 19.908
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 73622
    Number of Reflections(R-Free) 3719
    Percent Reflections(Observed) 99.89
    R-Factor(Observed) 0.1748
    R-Work 0.1769
    R-Free 0.1974
     
    Temperature Factor Modeling
    Mean Isotropic B Value 50.31
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1011
    Shell Resolution(Low) 2.1373
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3505
    R-Factor(R-Work) 0.2726
    R-Factor(R-Free) 0.2854
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1373
    Shell Resolution(Low) 2.1761
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3460
    R-Factor(R-Work) 0.2543
    R-Factor(R-Free) 0.2894
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1761
    Shell Resolution(Low) 2.2179
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3527
    R-Factor(R-Work) 0.2463
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2179
    Shell Resolution(Low) 2.2631
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3398
    R-Factor(R-Work) 0.2313
    R-Factor(R-Free) 0.244
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2631
    Shell Resolution(Low) 2.3122
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3522
    R-Factor(R-Work) 0.2296
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3122
    Shell Resolution(Low) 2.3659
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3457
    R-Factor(R-Work) 0.2207
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3659
    Shell Resolution(Low) 2.425
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3484
    R-Factor(R-Work) 0.2141
    R-Factor(R-Free) 0.2273
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.425
    Shell Resolution(Low) 2.4905
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3528
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.2604
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4905
    Shell Resolution(Low) 2.5636
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3449
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.2307
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5636
    Shell Resolution(Low) 2.6462
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3461
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6462
    Shell Resolution(Low) 2.7405
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3528
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7405
    Shell Resolution(Low) 2.8499
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3496
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8499
    Shell Resolution(Low) 2.9792
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3474
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9792
    Shell Resolution(Low) 3.1357
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3509
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2216
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1357
    Shell Resolution(Low) 3.3313
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3514
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.1962
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3313
    Shell Resolution(Low) 3.5871
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3476
    R-Factor(R-Work) 0.1626
    R-Factor(R-Free) 0.1977
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5871
    Shell Resolution(Low) 3.9455
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3485
    R-Factor(R-Work) 0.1458
    R-Factor(R-Free) 0.164
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9455
    Shell Resolution(Low) 4.5106
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3491
    R-Factor(R-Work) 0.1314
    R-Factor(R-Free) 0.1526
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5106
    Shell Resolution(Low) 5.6609
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3529
    R-Factor(R-Work) 0.1499
    R-Factor(R-Free) 0.1706
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6609
    Shell Resolution(Low) 19.8256
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3516
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.1725
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.01
    f_chiral_restr 0.065
    f_dihedral_angle_d 16.447
    f_angle_d 1.681
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6612
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 164
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP