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ELECTRON MICROSCOPY
Materials and Methods page
2YNJ
  •   EM Refinement Details Hide
    3D Reconstruction
    Reconstruction Method CONSTRAINED SINGLE PARTICLE TOMOGRAPHY
     
    EM Map-Model Fitting & Refinement
    Refinement Space REAL
    Refinement Target CORRELATION
    Fitting Procedure RIGID BODY
     
    EM Image Reconstruction Statistics
    Number of Particles 10000
    Nominal Pixel Size 1.74
    Actual Pixel Size 1.74
    Effective Resolution 8.4
    CTF Correction Method DEFOCUS VALUES WERE ASSIGNED TO EACH PARTICLE PROJECTION BASED ON THE DEFOCUS AT THE UNTILTED PLANE OF EACH TILT- SERIES AND A CORRECTION ACCORDING TO THE RELATIVE HEIGHT OF EACH PARTICLE. TO THIS PLANE
    Other Details SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD-2221. (DEPOSITION ID: 11174).
     
    Electron Microscope Sample
    Sample pH 7.5
    Sample Support Details HOLEY CARBON
    Sample Aggregation State PARTICLE
    Name of Sample GROEL
     
    Data Acquisition
    Date of Experiment 2011-10-07
    Num of Micrographs-Images Used 1595
    Temperature (Kelvin) 80.0
    Microscope Model OTHER
    Detector Type CCD
    Minimum Defocus (NM) 2000.0
    Maximum Defocus (NM) 3000.0
    Minimum Tilt Angle (degrees) -20.0
    Maximum Tilt Angle (degrees) 0.0
    Nominal CS 2.7
    Imaging Mode BRIGHT FIELD
    Electron Dose (electrons nm**-2) 25.0
    Illumination Mode FLOOD BEAM
    Nominal Magnification 47000
    Calibrated Magnification 47000
    Source FIELD EMISSION GUN
    Acceleration Voltage (KV) 80
    Imaging Details THE TOTAL DOSE OF 25 (ELECTRONS PER SQUARE ANGSTROM) WAS FRACTIONATED EVENLY ACROSS 11 TILTED PROJECTIONS TAKEN BETWEEN 0 AND -20 DEGREES TILT (EVERY 2 DEGREES).