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X-RAY DIFFRACTION
Materials and Methods page
2Y9E
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 100 MM HEPES (PH 7.5), 20% PEG10000
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55 α = 90
    b = 105.8 β = 90
    c = 180.5 γ = 90
     
    Space Group
    Space Group Name:    P 2 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2006-12-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID13
    Wavelength 0.9175
    Site ESRF
    Beamline ID13
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 3.4
    Resolution(Low) 20
    Number Reflections(Observed) 15092
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.14
    B(Isotropic) From Wilson Plot 40.1
    Redundancy 8.7
     
    High Resolution Shell Details
    Resolution(High) 3.4
    Resolution(Low) 3.66
    Percent Possible(All) 99.0
    R Merge I(Observed) 0.52
    Mean I Over Sigma(Observed) 2.44
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.397
    Resolution(Low) 19.962
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 15050
    Number of Reflections(R-Free) 760
    Percent Reflections(Observed) 99.66
    R-Factor(Observed) 0.2863
    R-Work 0.2816
    R-Free 0.3724
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.5038
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.6385
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.1175
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.397
    Shell Resolution(Low) 3.6578
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.293
    R-Factor(R-Free) 0.3908
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6578
    Shell Resolution(Low) 4.0232
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.2897
    R-Factor(R-Free) 0.3711
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0232
    Shell Resolution(Low) 4.5992
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2853
    R-Factor(R-Work) 0.2664
    R-Factor(R-Free) 0.3584
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5992
    Shell Resolution(Low) 5.7712
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2839
    R-Factor(R-Work) 0.2716
    R-Factor(R-Free) 0.3865
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7712
    Shell Resolution(Low) 19.9618
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3032
    R-Factor(R-Work) 0.2893
    R-Factor(R-Free) 0.3614
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.092
    f_dihedral_angle_d 20.072
    f_angle_d 1.447
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6092
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 256
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE