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X-RAY DIFFRACTION
Materials and Methods page
2Y8I
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 13% PEG 6000, 4% GLYCEROL., pH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55 α = 90
    b = 105.8 β = 90
    c = 180.5 γ = 90
     
    Space Group
    Space Group Name:    P 2 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Collection Date 2009-01-28
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-2
    Wavelength 0.9175
    Site ESRF
    Beamline ID23-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 3.13
    Resolution(Low) 20.22
    Number Reflections(Observed) 20093
    Percent Possible(Observed) 96.4
    R Merge I(Observed) 0.17
    Redundancy 11.1
     
    High Resolution Shell Details
    Resolution(High) 3.13
    Resolution(Low) 3.19
    Percent Possible(All) 83.4
    R Merge I(Observed) 0.46
    Mean I Over Sigma(Observed) 2.37
    Redundancy 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.132
    Resolution(Low) 20.215
    Cut-off Sigma(F) 1.33
    Number of Reflections(Observed) 18481
    Number of Reflections(R-Free) 942
    Percent Reflections(Observed) 96.35
    R-Factor(Observed) 0.2494
    R-Work 0.2447
    R-Free 0.3365
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -5.0714
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -9.7729
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.9893
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1324
    Shell Resolution(Low) 3.2969
    Number of Reflections(R-Free) 91
    Number of Reflections(R-Work) 1891
    R-Factor(R-Work) 0.2904
    R-Factor(R-Free) 0.38
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2969
    Shell Resolution(Low) 3.5025
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.2574
    R-Factor(R-Free) 0.358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5025
    Shell Resolution(Low) 3.7713
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.2298
    R-Factor(R-Free) 0.3738
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7713
    Shell Resolution(Low) 4.1478
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2216
    R-Factor(R-Free) 0.31
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1478
    Shell Resolution(Low) 4.7413
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1876
    R-Factor(R-Free) 0.304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7413
    Shell Resolution(Low) 5.9481
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2329
    R-Factor(R-Free) 0.276
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9481
    Shell Resolution(Low) 20.2159
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.2955
    R-Factor(R-Free) 0.3863
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.089
    f_dihedral_angle_d 23.988
    f_angle_d 1.36
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6090
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 258
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE