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X-RAY DIFFRACTION
Materials and Methods page
2Y7Y
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 135.52 α = 90
    b = 175.93 β = 90
    c = 128.91 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2005-10-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength 1
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.1
    Resolution(High) 1.9
    Resolution(Low) 52.06
    Number Reflections(Observed) 121101
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.09
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.0
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.6
    Mean I Over Sigma(Observed) 1.1
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.895
    Resolution(Low) 51.993
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 112093
    Number of Reflections(R-Free) 5598
    Percent Reflections(Observed) 92.11
    R-Factor(Observed) 0.1891
    R-Work 0.1871
    R-Free 0.2274
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8953
    Shell Resolution(Low) 1.9631
    Number of Reflections(R-Free) 483
    Number of Reflections(R-Work) 9371
    R-Factor(R-Work) 0.3631
    R-Factor(R-Free) 0.3835
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9631
    Shell Resolution(Low) 2.0417
    Number of Reflections(R-Free) 510
    Number of Reflections(R-Work) 9473
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.2583
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0417
    Shell Resolution(Low) 2.1346
    Number of Reflections(R-Free) 539
    Number of Reflections(R-Work) 10436
    R-Factor(R-Work) 0.1968
    R-Factor(R-Free) 0.2389
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1346
    Shell Resolution(Low) 2.2471
    Number of Reflections(R-Free) 530
    Number of Reflections(R-Work) 9980
    R-Factor(R-Work) 0.2451
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2471
    Shell Resolution(Low) 2.3879
    Number of Reflections(R-Free) 529
    Number of Reflections(R-Work) 10324
    R-Factor(R-Work) 0.1941
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3879
    Shell Resolution(Low) 2.5723
    Number of Reflections(R-Free) 605
    Number of Reflections(R-Work) 11078
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.2238
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5723
    Shell Resolution(Low) 2.8312
    Number of Reflections(R-Free) 561
    Number of Reflections(R-Work) 11309
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8312
    Shell Resolution(Low) 3.2408
    Number of Reflections(R-Free) 608
    Number of Reflections(R-Work) 11415
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2408
    Shell Resolution(Low) 4.0828
    Number of Reflections(R-Free) 577
    Number of Reflections(R-Work) 11520
    R-Factor(R-Work) 0.1506
    R-Factor(R-Free) 0.1901
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0828
    Shell Resolution(Low) 52.0128
    Number of Reflections(R-Free) 656
    Number of Reflections(R-Work) 11589
    R-Factor(R-Work) 0.1687
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.087
    f_dihedral_angle_d 13.207
    f_angle_d 1.194
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8061
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 1158
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP