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X-RAY DIFFRACTION
Materials and Methods page
2Y2V
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 26-30% (V/V) PEG 750MME, 0.1 M HEPES PH 7.0.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.49 α = 90
    b = 111.64 β = 90
    c = 227.03 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (SX-165)
    Type MARRESEARCH
    Details MIRRORS
    Collection Date 2009-05-13
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength 1.03908
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.45
    Resolution(Low) 29.14
    Number Reflections(Observed) 306983
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 50.46
    Redundancy 4.1
     
    High Resolution Shell Details
    Resolution(High) 2.45
    Resolution(Low) 2.58
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.46
    Mean I Over Sigma(Observed) 4.2
    Redundancy 4.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.45
    Resolution(Low) 28.979
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 74170
    Number of Reflections(R-Free) 1474
    Percent Reflections(Observed) 98.79
    R-Factor(Observed) 0.1854
    R-Work 0.1847
    R-Free 0.2244
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.6269
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.1234
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.7503
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.45
    Shell Resolution(Low) 2.529
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 6539
    R-Factor(R-Work) 0.242
    R-Factor(R-Free) 0.268
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.529
    Shell Resolution(Low) 2.6194
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 6520
    R-Factor(R-Work) 0.2262
    R-Factor(R-Free) 0.2881
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6194
    Shell Resolution(Low) 2.7242
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 6588
    R-Factor(R-Work) 0.2229
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7242
    Shell Resolution(Low) 2.848
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6599
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2864
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.848
    Shell Resolution(Low) 2.9981
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 6566
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2674
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9981
    Shell Resolution(Low) 3.1857
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 6646
    R-Factor(R-Work) 0.2072
    R-Factor(R-Free) 0.2553
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1857
    Shell Resolution(Low) 3.4313
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 6630
    R-Factor(R-Work) 0.1887
    R-Factor(R-Free) 0.2235
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4313
    Shell Resolution(Low) 3.7759
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6611
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7759
    Shell Resolution(Low) 4.3208
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 6621
    R-Factor(R-Work) 0.1472
    R-Factor(R-Free) 0.1847
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3208
    Shell Resolution(Low) 5.4378
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 6651
    R-Factor(R-Work) 0.1357
    R-Factor(R-Free) 0.166
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4378
    Shell Resolution(Low) 28.9811
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 6725
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.2033
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 18.056
    f_angle_d 1.119
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8272
    Nucleic Acid Atoms 0
    Heterogen Atoms 109
    Solvent Atoms 727
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFMAC