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X-RAY DIFFRACTION
Materials and Methods page
2Y1K
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 0.1 M MES PH 6.5, 2.1 M AMMONIUM SULFATE.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 153.77 α = 90
    b = 153.77 β = 90
    c = 127.6 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2010-04-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9765
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 4.8
    Resolution(High) 2.5
    Resolution(Low) 40
    Number Reflections(Observed) 25339
    Percent Possible(Observed) 94.8
    R Merge I(Observed) 0.09
    Redundancy 6.7
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.6
    Percent Possible(All) 97.4
    R Merge I(Observed) 0.4
    Mean I Over Sigma(Observed) 4.8
    Redundancy 7.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 2.5
    Resolution(Low) 41.38
    Number of Reflections(Observed) 24577
    Number of Reflections(R-Free) 760
    Percent Reflections(Observed) 94.79
    R-Factor(Observed) 0.1848
    R-Work 0.18281
    R-Free 0.24706
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 61.361
    Anisotropic B[1][1] 0.02
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.02
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.04
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.565
    Number of Reflections(R-Free) 53
    Number of Reflections(R-Work) 1713
    R-Factor(R-Work) 0.265
    R-Factor(R-Free) 0.432
    Percent Reflections(Observed) 97.19
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.009
    r_chiral_restr 0.151
    r_dihedral_angle_4_deg 15.683
    r_dihedral_angle_3_deg 18.567
    r_dihedral_angle_2_deg 37.736
    r_dihedral_angle_1_deg 7.481
    r_angle_refined_deg 1.933
    r_bond_refined_d 0.018
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4180
    Nucleic Acid Atoms 0
    Heterogen Atoms 175
    Solvent Atoms 229
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Refinement REFMAC 5.6.0093
     
    Software
    refinement REFMAC version: 5.6.0093