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X-RAY DIFFRACTION
Materials and Methods page
2Y0R
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 100 MM MES (PH 6.5), 25% PEG 8000.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.6 α = 90
    b = 106 β = 90
    c = 178.9 γ = 90
     
    Space Group
    Space Group Name:    P 2 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Collection Date 2006-12-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID13
    Wavelength 0.9175
    Site ESRF
    Beamline ID13
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.5
    Resolution(High) 2.85
    Resolution(Low) 91.29
    Number Reflections(Observed) 23285
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.18
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 2.85
    Resolution(Low) 2.92
    Percent Possible(All) 77.2
    R Merge I(Observed) 0.46
    Mean I Over Sigma(Observed) 2.61
    Redundancy 4.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.85
    Resolution(Low) 19.98
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 24550
    Number of Reflections(R-Free) 1241
    Percent Reflections(Observed) 98.3
    R-Factor(Observed) 0.2558
    R-Work 0.2528
    R-Free 0.3011
     
    Temperature Factor Modeling
    Mean Isotropic B Value 35.56
    Anisotropic B[1][1] -0.6
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.36
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.96
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.85
    Shell Resolution(Low) 2.9638
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2183
    R-Factor(R-Work) 0.301
    R-Factor(R-Free) 0.3866
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9638
    Shell Resolution(Low) 3.0982
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2908
    R-Factor(R-Free) 0.3371
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0982
    Shell Resolution(Low) 3.2609
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.2778
    R-Factor(R-Free) 0.3858
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2609
    Shell Resolution(Low) 3.4642
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.283
    R-Factor(R-Free) 0.3565
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4642
    Shell Resolution(Low) 3.7301
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2448
    R-Factor(R-Free) 0.3292
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7301
    Shell Resolution(Low) 4.1026
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.2314
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1026
    Shell Resolution(Low) 4.6895
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.2114
    R-Factor(R-Free) 0.2698
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6895
    Shell Resolution(Low) 5.8831
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.2411
    R-Factor(R-Free) 0.2991
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8831
    Shell Resolution(Low) 19.9757
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2782
    R-Factor(R-Work) 0.2631
    R-Factor(R-Free) 0.3014
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.041
    f_dihedral_angle_d 13.81
    f_angle_d 0.572
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6090
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 379
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE