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X-RAY DIFFRACTION
Materials and Methods page
2XYS
  •   Crystallization Hide
    Crystallization Experiments
    Details 200 MM SODIUM ACETATE, 100 MM BISTRISPROPANE AT PH 8.5, 15.5% PEG3350
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.59 α = 90
    b = 100.59 β = 90
    c = 289.68 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 210)
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength 0.9334
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.3
    Resolution(High) 1.91
    Resolution(Low) 49.56
    Number Reflections(Observed) 113796
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 21.93
    Redundancy 5.6
     
    High Resolution Shell Details
    Resolution(High) 1.91
    Resolution(Low) 2.01
    Percent Possible(All) 91.7
    R Merge I(Observed) 0.62
    Mean I Over Sigma(Observed) 2.3
    Redundancy 4.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.909
    Resolution(Low) 44.608
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 107844
    Number of Reflections(R-Free) 5414
    Percent Reflections(Observed) 92.86
    R-Factor(Observed) 0.1738
    R-Work 0.1718
    R-Free 0.2097
     
    Temperature Factor Modeling
    Mean Isotropic B Value 26.24
    Anisotropic B[1][1] -1.6395
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.6395
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.2789
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.909
    Shell Resolution(Low) 1.9772
    Number of Reflections(R-Free) 437
    Number of Reflections(R-Work) 8002
    R-Factor(R-Work) 0.249
    R-Factor(R-Free) 0.2898
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9772
    Shell Resolution(Low) 2.0564
    Number of Reflections(R-Free) 502
    Number of Reflections(R-Work) 9539
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2564
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0564
    Shell Resolution(Low) 2.15
    Number of Reflections(R-Free) 520
    Number of Reflections(R-Work) 9989
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2465
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.15
    Shell Resolution(Low) 2.2633
    Number of Reflections(R-Free) 520
    Number of Reflections(R-Work) 10233
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2633
    Shell Resolution(Low) 2.4051
    Number of Reflections(R-Free) 509
    Number of Reflections(R-Work) 10484
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4051
    Shell Resolution(Low) 2.5908
    Number of Reflections(R-Free) 551
    Number of Reflections(R-Work) 10583
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.2154
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5908
    Shell Resolution(Low) 2.8515
    Number of Reflections(R-Free) 570
    Number of Reflections(R-Work) 10657
    R-Factor(R-Work) 0.1741
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8515
    Shell Resolution(Low) 3.264
    Number of Reflections(R-Free) 594
    Number of Reflections(R-Work) 10824
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.264
    Shell Resolution(Low) 4.1119
    Number of Reflections(R-Free) 587
    Number of Reflections(R-Work) 10926
    R-Factor(R-Work) 0.1495
    R-Factor(R-Free) 0.181
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1119
    Shell Resolution(Low) 44.6198
    Number of Reflections(R-Free) 624
    Number of Reflections(R-Work) 11193
    R-Factor(R-Work) 0.1583
    R-Factor(R-Free) 0.1785
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.079
    f_dihedral_angle_d 15.558
    f_angle_d 1.194
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8180
    Nucleic Acid Atoms 0
    Heterogen Atoms 150
    Solvent Atoms 1105
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP