POP-OUT | CLOSE
 
ELECTRON MICROSCOPY
Materials and Methods page
2XUY
  •   EM Refinement Details Hide
    3D Reconstruction
    Reconstruction Method MULTIPARTICLE REFINEMENT
     
    EM Map-Model Fitting & Refinement
    Refinement Space REAL
    Refinement Protocol X-RAY
    Fitting Procedure MDFIT
     
    EM Image Reconstruction Statistics
    Nominal Pixel Size 1.26
    Actual Pixel Size 1.26
    Effective Resolution 7.6
    CTF Correction Method DEFOCUS GROUPS
    Other Details SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD-1799. (DEPOSITION ID: 7584).
     
    Electron Microscope Sample
    Sample Support Details HOLEY CARBON
    Sample Vitrification Details VITRIFICATION 1 -- CRYOGEN- ETHANE, INSTRUMENT- VITROBOT (FEI)
    Sample Aggregation State PARTICLE
    Name of Sample 70S-EFG-GDP-FA COMPLEX
     
    Data Acquisition
    Num of Micrographs-Images Used 677
    Temperature (Kelvin) 77.0
    Microscope Model OTHER
    Detector Type KODAK SO163 FILM
    Minimum Defocus (NM) 2000.0
    Maximum Defocus (NM) 4000.0
    Nominal CS 2.0
    Imaging Mode BRIGHT FIELD
    Electron Dose (electrons nm**-2) 20.0
    Illumination Mode FLOOD BEAM
    Nominal Magnification 39000
    Calibrated Magnification 65520
    Source FIELD EMISSION GUN
    Acceleration Voltage (KV) 300
    Imaging Details LOW-DOSE