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X-RAY DIFFRACTION
Materials and Methods page
2XQW
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 12-18% PEG 4000, 0.1 M HEPES, PH 7.5, AT 22 DEGREES C
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 103.55 α = 90
    b = 103.55 β = 90
    c = 141.21 γ = 120
     
    Space Group
    Space Group Name:    P 61
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Details MIRRORS
    Collection Date 2009-06-29
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 0.983
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(Observed) 37791
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 43.65
    Redundancy 5.6
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.44
    Percent Possible(All) 98.5
    R Merge I(Observed) 0.75
    Mean I Over Sigma(Observed) 2.36
    Redundancy 5.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.306
    Resolution(Low) 41.753
    Cut-off Sigma(F) 1.39
    Number of Reflections(Observed) 36767
    Number of Reflections(R-Free) 3723
    Percent Reflections(Observed) 99.41
    R-Factor(Observed) 0.2026
    R-Work 0.2005
    R-Free 0.242
     
    Temperature Factor Modeling
    Mean Isotropic B Value 53.18
    Anisotropic B[1][1] 5.7952
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.7952
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.5904
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3055
    Shell Resolution(Low) 2.3347
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2347
    R-Factor(R-Work) 0.3089
    R-Factor(R-Free) 0.3398
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3347
    Shell Resolution(Low) 2.3654
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2941
    R-Factor(R-Free) 0.3558
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3654
    Shell Resolution(Low) 2.3978
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.2879
    R-Factor(R-Free) 0.2983
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3978
    Shell Resolution(Low) 2.4321
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.2759
    R-Factor(R-Free) 0.3372
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4321
    Shell Resolution(Low) 2.4684
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.2646
    R-Factor(R-Free) 0.3339
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4684
    Shell Resolution(Low) 2.5069
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.2514
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5069
    Shell Resolution(Low) 2.548
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2484
    R-Factor(R-Free) 0.2903
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.548
    Shell Resolution(Low) 2.5919
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.2382
    R-Factor(R-Free) 0.2562
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5919
    Shell Resolution(Low) 2.6391
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6391
    Shell Resolution(Low) 2.6898
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2561
    R-Factor(R-Free) 0.2878
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6898
    Shell Resolution(Low) 2.7447
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.3225
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7447
    Shell Resolution(Low) 2.8044
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.2384
    R-Factor(R-Free) 0.2578
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8044
    Shell Resolution(Low) 2.8696
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2282
    R-Factor(R-Free) 0.3192
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8696
    Shell Resolution(Low) 2.9414
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9414
    Shell Resolution(Low) 3.0209
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2113
    R-Factor(R-Free) 0.2077
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0209
    Shell Resolution(Low) 3.1097
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.2151
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1097
    Shell Resolution(Low) 3.2101
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2145
    R-Factor(R-Free) 0.2664
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2101
    Shell Resolution(Low) 3.3247
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2922
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3247
    Shell Resolution(Low) 3.4578
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.2181
    R-Factor(R-Free) 0.2219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4578
    Shell Resolution(Low) 3.6151
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1913
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6151
    Shell Resolution(Low) 3.8056
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8056
    Shell Resolution(Low) 4.0438
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2549
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2567
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0438
    Shell Resolution(Low) 4.3557
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3557
    Shell Resolution(Low) 4.7935
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7935
    Shell Resolution(Low) 5.4858
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4858
    Shell Resolution(Low) 6.9065
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.9065
    Shell Resolution(Low) 41.7602
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.067
    f_dihedral_angle_d 18.57
    f_angle_d 0.96
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5507
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 193
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER