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X-RAY DIFFRACTION
Materials and Methods page
2XJP
  •   Crystallization Hide
    Crystallization Experiments
    Details 0.5 M NACL, 0.1 M BISTRIS PH7.5, 20% PEG 4000
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.28 α = 90
    b = 61.82 β = 90
    c = 106.26 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (Q315R)
    Type ADSC
    Details CYLINDRICAL GRAZING INCIDENCE MIRROR
    Collection Date 2008-11-24
     
    Diffraction Radiation
    Monochromator SI (311)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength 0.9149
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 0.95
    Resolution(Low) 40.29
    Number Reflections(Observed) 190329
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.03
    B(Isotropic) From Wilson Plot 7.0
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 0.95
    Resolution(Low) 1.0
    Percent Possible(All) 95.7
    R Merge I(Observed) 0.44
    Mean I Over Sigma(Observed) 2.8
    Redundancy 3.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SIRAS
    reflnsShellList 0.95
    Resolution(Low) 20.0
    Number of Reflections(Observed) 186922
    Number of Reflections(R-Free) 3390
    Percent Reflections(Observed) 99.22
    R-Factor(Observed) 0.10553
    R-Work 0.10523
    R-Free 0.12236
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 12.246
    Anisotropic B[1][1] 0.22
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.69
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.46
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.95
    Shell Resolution(Low) 0.975
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 12582
    R-Factor(R-Work) 0.244
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 91.42
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_rigid_bond_restr 2.11
    r_scangle_it 5.877
    r_scbond_it 4.35
    r_mcangle_it 4.904
    r_mcbond_other 0.463
    r_mcbond_it 3.471
    r_gen_planes_other 0.003
    r_gen_planes_refined 0.015
    r_chiral_restr 0.134
    r_dihedral_angle_4_deg 6.334
    r_dihedral_angle_3_deg 12.729
    r_dihedral_angle_2_deg 35.547
    r_dihedral_angle_1_deg 7.849
    r_angle_other_deg 0.988
    r_angle_refined_deg 2.071
    r_bond_other_d 0.001
    r_bond_refined_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1926
    Nucleic Acid Atoms 0
    Heterogen Atoms 41
    Solvent Atoms 460
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELX CDE
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building SHELX version: CDE